Ph.D. candidate
in Ingegneria Informatica E Dei Sistemi , 36th cycle (2020-2023)
Department of Control and Computer Engineering (DAUIN)
Profile
PhD
Thesis title
New techniques for quality and reliability enhancement in electronic systems
Research topic
New strategies for quality and reliability improvement in electronics systems.
Tutors
- Matteo Sonza Reorda
- Michelangelo Grosso
- Ioannis Deretzis
Research presentation
Research interests
Biography
He has worked as a physical design engineer at STMicroelectronics since 2019.
In 2020 he started a joint industrial PhD program with Politecnico di Torino and Consiglio Nazionale delle Ricerche (CNR).
His research interests include test and reliability of digital integrated circuits and optimization of physical design flows.
Publications
Latest publications View all publications in Porto@Iris
- Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (In stampa)
Targeting different defect-oriented fault models in IC testing: an experimental approach. In: 26th Euromicro Conference Series on Digital System Design (DSD), Durres (ALB), 6-8 September, 2023, pp. 1-6
Contributo in Atti di Convegno (Proceeding) - Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2022)
A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
Contributo in Atti di Convegno (Proceeding) - Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
Contributo in Atti di Convegno (Proceeding) - Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Contributo su Rivista - Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120. ISSN 0026-2714
Contributo su Rivista