Michelangelo Grosso

Master of Science

• System and device programming. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• System and device programming. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• System and device programming. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Bachelor of Science

• Calcolatori elettronici. A.A. 2021/22, INGEGNERIA INFORMATICA. Collaboratore del corso
• Calcolatori elettronici. A.A. 2020/21, INGEGNERIA INFORMATICA. Collaboratore del corso
• Calcolatori elettronici. A.A. 2019/20, INGEGNERIA INFORMATICA. Collaboratore del corso
• Calcolatori elettronici. A.A. 2019/20, INGEGNERIA INFORMATICA. Collaboratore del corso

• Reza Khoshzaban. Programme in Ingegneria Informatica E Dei Sistemi (39^th cycle, 2023-in progress)
• Nunzio Mirabella. Programme in Ingegneria Informatica E Dei Sistemi (36^th cycle, 2020-2024)
  Thesis: New techniques for quality and reliability enhancement in electronic systems
  
  Cybersecurity
  Cybersecurity
  Cybersecurity

• Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; ... (2024)
  Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test. In: 2024 IEEE European Test Symposium (ETS), The Hague (NL), 20-24 May 2024. ISBN: 979-8-3503-4932-0
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
  Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
  An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
  Contributo su Rivista
• Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
  Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120 (114100). ISSN 0026-2714
  Contributo su Rivista
• Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; ... (2021)
  Comparing different solutions for testing resistive defects in low-power SRAMs. In: 22nd IEEE Latin-American Test Symposium 2021, Porto Alegre (Brazil), 27th - 29th October 2021, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)