Ph.D. in Ingegneria Informatica E Dei Sistemi , 20th cycle (2005-2007)
Ph.D. obtained in 2008
Dissertation:
Test and Diagnosis Techniques for Systems-on-Chip
Tutors:
Matteo Sonza ReordaResearch
Supervised PhD students
- Reza Khoshzaban. Programme in Ingegneria Informatica E Dei Sistemi (cycle 39, 2023-in progress)
- Nunzio Mirabella. Programme in Ingegneria Informatica E Dei Sistemi (cycle 36, 2020-2024)
Thesis: New techniques for quality and reliability enhancement in electronic systems
Cybersecurity Cybersecurity Cybersecurity
Publications
Latest publications View all publications in Porto@Iris
- Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; ... (2024)
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test. In: 2024 IEEE European Test Symposium (ETS), The Hague (NL), 20-24 May 2024. ISBN: 979-8-3503-4932-0
Contributo in Atti di Convegno (Proceeding) - Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2023)
Targeting different defect-oriented fault models in IC testing: an experimental approach. In: 26th Euromicro Conference Series on Digital System Design (DSD), Golem (ALB), 6-8 September, 2023, pp. 214-219. ISBN: 979-8-3503-4419-6
Contributo in Atti di Convegno (Proceeding) - Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2022)
A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
Contributo in Atti di Convegno (Proceeding) - Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
Contributo in Atti di Convegno (Proceeding) - Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Contributo su Rivista