Ph.D. in Ingegneria Informatica E Dei Sistemi , 20th cycle (2005-2007)
Ph.D. obtained in 2008
Dissertation:
Test and Diagnosis Techniques for Systems-on-Chip
Tutors:
Matteo Sonza ReordaResearch
Supervised PhD students
- Reza Khoshzaban. Programme in Ingegneria Informatica E Dei Sistemi (cycle 39, 2023-in progress)
Research subject: Innovative techniques to improve the reliability of embedded and HPC systems
Computer architectures and Computer aided design Controls and system engineering Computer architectures and Computer aided design Controls and system engineering - Nunzio Mirabella. Programme in Ingegneria Informatica E Dei Sistemi (cycle 36, 2020-2024)
Thesis: New techniques for quality and reliability enhancement in electronic systems
Cybersecurity Cybersecurity Cybersecurity
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Appello, D; Bernardi, Paolo; Bruno, M; Cagliesi, R; Giancarlini, M; Grosso, ... (2008)
An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization. In: 2nd IEEE International Workshop on Automated Test Equipment: Vision ATE 2020
Contributo in Atti di Convegno (Proceeding) - Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, ... (2008)
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm. In: 26th IEEE VLSI Test Symposium, San Diego, CA, USA, apr 27 - may 1, pp. 389-394. ISBN: 9780769531236
Contributo in Atti di Convegno (Proceeding) - Appello, D; Bernardi, Paolo; Cagliesi, R; Giancarlini, M; Grosso, Michelangelo (2008)
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. In: 13th IEEE European Test Symposium, 2008, Verbania, Italia, may 25 - 29, 2008, pp. 140-145. ISBN: 9780769531502
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Christou, K; Grosso, Michelangelo; Michael, M; SANCHEZ SANCHEZ, EDGAR ... (2008)
Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors. In: European Workshops on the Theory and Applications of Evolutionary Computation, EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog, Naples (IT), March 26-28, 2008, pp. 224-234. ISSN 0302-9743. ISBN: 9783540787600
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2007)
A System-layer Infrastructure for SoC Diagnosis. In: JOURNAL OF ELECTRONIC TESTING, vol. 23, pp. 389-404. ISSN 0923-8174
Contributo su Rivista - LAGOS BENITES, J; Appello, D; Bernardi, Paolo; Grosso, Michelangelo; Ravotto, Danilo; ... (2007)
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. In: DFT2007, 22th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 291-299. ISBN: 9789780769529
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, ... (2007)
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. In: IEEE European Test Symposium, Freiburg, Germany, 20-24 May 2007, pp. 179-184
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo (2007)
Hardware-Accelerated Path-Delay Fault Grading of Functional Test Programs for Processor-based Systems. In: ACM Great Lakes Symposium on VLSI GLSVLSI, Stresa-Lago Maggiore, Italy, 11-13 Marzo 2007, pp. 411-416. ISBN: 9781595936059
Contributo in Atti di Convegno (Proceeding) - Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2007)
Safety Evaluation of NanoFabrics. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Roma, Italy, 26-28 September, 2007, pp. 418-426
Contributo in Atti di Convegno (Proceeding) - Appello, D; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, ... (2006)
Embedded Memory Diagnosis: An Industrial Workflow. In: IEEE International Test Conference ITC, Santa Clara, CA, USA, 24-26 Ottobre 2006, pp. 1-9. ISBN: 9781424402922
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo (2006)
Test Considerations about the Structured ASIC Paradigm. In: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems DDECS, Prague, Czech Republic, 18-21 Aprile 2006, pp. 230-231
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2006)
A pattern ordering algorithm for reducing the size of fault dictionaries. In: IEEE VLSI Test Symposium VTS, Berkeley, CA, USA, 30 Aprile - 4 Maggio 2006, pp. 166-171
Contributo in Atti di Convegno (Proceeding) - Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo (2006)
System-in-package testing: problems and solutions. In: IEEE DESIGN & TEST OF COMPUTERS, vol. Volume: 23 , Issue: 3, pp. 203-211. ISSN 0740-7475
Contributo su Rivista - D., Appello; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, ... (2006)
On the automation of the test flow of complex SoCs. In: IEEE VLSI Test Symposium VTS, Berkeley, CA, USA, 30 Aprile - 4 Maggio 2006, pp. 386-391
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
Exploiting an I-IP for both test and silicon debug of microprocessor cores. In: International Workshop on Microprocessor Test and Verification MTV, Austin, TX, USA, 3-4 Novembre 2005, pp. 55-62
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
Exploiting an Infrastructure-IP to reduce memory diagnosis costs in SoCs. In: IEEE European Test Symposium, Tallinn, Estonia, 22-25 Maggio 2005, pp. 202-207
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
On the diagnosis of SoCs including multiple memory cores. In: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Sopron, Hungary, 13-16 Aprile, 2005, pp. 75-80
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo; D., ... (2005)
A Tool for Supporting and Automating the Test of Complex System-on-Chips. In: ITSW 2005: IEEE International Test Synthesis Workshop, San Antonio, Texas, USA, 11-12 aprile 2005
Contributo in Atti di Convegno (Proceeding) - D., Appello; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
An I-IP for the Debug of Microprocessor Cores. In: DCIS05: XX Conference on Design of Circuits and Integrated Systems, Lisbona, Portogallo, 23-25 Novembre 2005
Contributo in Atti di Convegno (Proceeding) - D., Appello; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, ... (2005)
A new DFM-proactive technique. In: SDD'05: 2nd IEEE International Workshop on Silicon Debug and Diagnosis, Austin, Texas, USA, 10 - 11 novembre 2005
Contributo in Atti di Convegno (Proceeding)