Dottorato in Ingegneria Informatica E Dei Sistemi , 20o ciclo (2005-2007)
Dottorato concluso nel 2008
Tesi:
Test and Diagnosis Techniques for Systems-on-Chip
Tutori:
Matteo Sonza ReordaRicerca
Dottorandi
- Reza Khoshzaban. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 39, 2023-in corso)
Computer architectures and Computer aided design Controls and system engineering
Pubblicazioni
Pubblicazioni durante il dottorato Vedi tutte le pubblicazioni su Porto@Iris
- Appello, D; Bernardi, Paolo; Cagliesi, R; Giancarlini, M; Grosso, Michelangelo (2008)
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. In: 13th IEEE European Test Symposium, 2008, Verbania, Italia, may 25 - 29, 2008, pp. 140-145. ISBN: 9780769531502
Contributo in Atti di Convegno (Proceeding) - Appello, D; Bernardi, Paolo; Bruno, M; Cagliesi, R; Giancarlini, M; Grosso, ... (2008)
An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization. In: 2nd IEEE International Workshop on Automated Test Equipment: Vision ATE 2020
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Christou, K; Grosso, Michelangelo; Michael, M; SANCHEZ SANCHEZ, EDGAR ... (2008)
Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors. In: European Workshops on the Theory and Applications of Evolutionary Computation, EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog, Naples (IT), March 26-28, 2008, pp. 224-234. ISSN 0302-9743. ISBN: 9783540787600
Contributo in Atti di Convegno (Proceeding) - Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, ... (2008)
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm. In: 26th IEEE VLSI Test Symposium, San Diego, CA, USA, apr 27 - may 1, pp. 389-394. ISBN: 9780769531236
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2007)
A System-layer Infrastructure for SoC Diagnosis. In: JOURNAL OF ELECTRONIC TESTING, vol. 23, pp. 389-404. ISSN 0923-8174
Contributo su Rivista - Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2007)
Safety Evaluation of NanoFabrics. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Roma, Italy, 26-28 September, 2007, pp. 418-426
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, ... (2007)
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. In: IEEE European Test Symposium, Freiburg, Germany, 20-24 May 2007, pp. 179-184
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo (2007)
Hardware-Accelerated Path-Delay Fault Grading of Functional Test Programs for Processor-based Systems. In: ACM Great Lakes Symposium on VLSI GLSVLSI, Stresa-Lago Maggiore, Italy, 11-13 Marzo 2007, pp. 411-416. ISBN: 9781595936059
Contributo in Atti di Convegno (Proceeding) - LAGOS BENITES, J; Appello, D; Bernardi, Paolo; Grosso, Michelangelo; Ravotto, Danilo; ... (2007)
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. In: DFT2007, 22th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 291-299. ISBN: 9789780769529
Contributo in Atti di Convegno (Proceeding) - Appello, D; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, ... (2006)
Embedded Memory Diagnosis: An Industrial Workflow. In: IEEE International Test Conference ITC, Santa Clara, CA, USA, 24-26 Ottobre 2006, pp. 1-9. ISBN: 9781424402922
Contributo in Atti di Convegno (Proceeding) - Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo (2006)
System-in-package testing: problems and solutions. In: IEEE DESIGN & TEST OF COMPUTERS, vol. Volume: 23 , Issue: 3, pp. 203-211. ISSN 0740-7475
Contributo su Rivista - D., Appello; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, ... (2006)
On the automation of the test flow of complex SoCs. In: IEEE VLSI Test Symposium VTS, Berkeley, CA, USA, 30 Aprile - 4 Maggio 2006, pp. 386-391
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2006)
A pattern ordering algorithm for reducing the size of fault dictionaries. In: IEEE VLSI Test Symposium VTS, Berkeley, CA, USA, 30 Aprile - 4 Maggio 2006, pp. 166-171
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo (2006)
Test Considerations about the Structured ASIC Paradigm. In: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems DDECS, Prague, Czech Republic, 18-21 Aprile 2006, pp. 230-231
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo; D., ... (2005)
A Tool for Supporting and Automating the Test of Complex System-on-Chips. In: ITSW 2005: IEEE International Test Synthesis Workshop, San Antonio, Texas, USA, 11-12 aprile 2005
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
Exploiting an I-IP for both test and silicon debug of microprocessor cores. In: International Workshop on Microprocessor Test and Verification MTV, Austin, TX, USA, 3-4 Novembre 2005, pp. 55-62
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Manzone, A; Rebaudengo, Maurizio; SANCHEZ ... (2005)
Integrating BIST techniques for on-line SoC testing. In: IEEE International On-Line Test Symposium IOLTS, Saint Raphael, France, 6-8 Luglio, 2005, pp. 235-240
Contributo in Atti di Convegno (Proceeding) - D., Appello; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, ... (2005)
A new DFM-proactive technique. In: SDD'05: 2nd IEEE International Workshop on Silicon Debug and Diagnosis, Austin, Texas, USA, 10 - 11 novembre 2005
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
On the diagnosis of SoCs including multiple memory cores. In: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Sopron, Hungary, 13-16 Aprile, 2005, pp. 75-80
Contributo in Atti di Convegno (Proceeding) - D., Appello; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo (2005)
An I-IP for the Debug of Microprocessor Cores. In: DCIS05: XX Conference on Design of Circuits and Integrated Systems, Lisbona, Portogallo, 23-25 Novembre 2005
Contributo in Atti di Convegno (Proceeding)