• Collegio di Ingegneria Informatica, del Cinema e Meccatronica. Componente
• Collegio di Ingegneria Meccanica, Aerospaziale e dell'Autoveicolo. Componente

Corso di laurea magistrale

• Testing of electronic systems. A.A. 2015/16, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Testing and fault tolerance. A.A. 2016/17, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Corso di laurea di 1° livello

• Computer sciences. A.A. 2014/15, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2014/15, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2015/16, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2015/16, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2016/17, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Sistemi operativi. A.A. 2016/17, INGEGNERIA INFORMATICA. Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

Progetti finanziati da contratti commerciali

• Automatic Test Pattern Generator (ATPG) tool based on MicroGP3 plus a functional fault simulator for the generation of STL patterns for a RISC-V processor , (2025-2026) - Responsabile Scientifico
  Ricerca Commerciale
• Contratto di ricerca tra il Politecnico di Torino (DISAT) e la Società Dana-TM4 Italia S.r.l. per la realizzazione del Progetto di Ricerca “Analisi dello stato dell’arte di power modules, Studio e Sviluppo di una nuova generazione di power module LV, analisi di affidabilità e test di qualifica” , (2023-2025) - Responsabile Scientifico
  Ricerca Commerciale
• A3G Speed Monitor Modelling (phase 4) , (2024-2025) - Responsabile Scientifico
  Ricerca Commerciale
• ATPG design , (2024-2025) - Responsabile Scientifico
  Ricerca Commerciale
• Research and Development Agreement tra il Politecnico di Torino (DAUIN) e la Società Infineon Technologies Germania AG per la realizzazione del Progetto di Ricerca “A3G Speed Monitor Modelling” , (2023-2024) - Responsabile Scientifico
  Ricerca Commerciale
• A3G Speed Monitor Modelling , (2021-2021) - Responsabile Scientifico
  Ricerca Commerciale
• Machine Learning techniques for the prediction of failures based on in-situ sensors values (phase two) , (2020-2020) - Responsabile Scientifico
  Ricerca Commerciale
• Redundancy repair algorithm definition for A3G ESF3 based on Array Fail Diagnostic and Suspect Learning , (2019-2020) - Responsabile Scientifico
  Ricerca Commerciale

• Michelangelo Bartolomucci. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 39, 2023-in corso)
  Argomento della ricerca: Metodologie per la Functional Safety di prossima generazione/Analisi e verifica di Soft Errors
  
  Computer architectures and Computer aided design
  Computer architectures and Computer aided design
• Reza Khoshzaban. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 39, 2023-in corso)
  
  Computer architectures and Computer aided design
  Controls and system engineering
  Computer architectures and Computer aided design
  Controls and system engineering
• Changhao Wang. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 39, 2023-in corso)
  Argomento della ricerca: Advanced Techniques for AI-Driven Test and Reliability of Digital Circuits
  
  Computer architectures and Computer aided design
  Data science, Computer vision and AI
• Gabriele Filipponi. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 38, 2022-in corso)
  
  Computer architectures and Computer aided design
  Computer architectures and Computer aided design
• Tommaso Foscale. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 38, 2022-in corso)
  
  Computer architectures and Computer aided design
  Computer architectures and Computer aided design
• Nima Kolahimahmoudi. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 38, 2023-in corso)
  
  Computer architectures and Computer aided design
  Computer architectures and Computer aided design
• Francesco Angione. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 37, 2021-2025)
  Tesi: System-Level Test techniques for Automotive SoCs
  
  Computer architectures and Computer aided design
  Controls and system engineering
  Software engineering and Mobile computing
  Computer architectures and Computer aided design
  Controls and system engineering
  Software engineering and Mobile computing
• Nicolo' Bellarmino. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 37, 2021-2024)
  Tesi: Computational Intelligence for Computer-Aided Design Machine Learning Techniques for Microcontrollers Performance Screenings
  
  Computer graphics and Multimedia
  Controls and system engineering
  Cybersecurity
  Data science, Computer vision and AI
  Life sciences
  Computer graphics and Multimedia
  Controls and system engineering
  Cybersecurity
  Data science, Computer vision and AI
  Life sciences
• Giorgio Insinga. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 37, 2021-2025)
  Tesi: Test and diagnosis of memories embedded in Automotive SoCs
  
  Computer architectures and Computer aided design
  Computer architectures and Computer aided design
• Nikolaos Deligiannis. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 36, 2020-2024)
  Tesi: Formal Methods for Test and Reliability
  
  Controls and system engineering
  Data science, Computer vision and AI
  Controls and system engineering
  Data science, Computer vision and AI
• Sandro Sartoni. Corso in Ingegneria Informatica E Dei Sistemi (ciclo 35, 2019-2023)
  Tesi: New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies
  
  Controls and system engineering
  Controls and system engineering

• Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ... (2017)
  A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. In: 2017 18th IEEE Latin American Test Symposium (LATS), Bogota (CO), 13-15 March 2017, pp. 1-6. ISBN: 978-1-5386-0415-1
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; ... (2017)
  Software-Based Self-Test Techniques for Dual-Issue Embedded Processors. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. ISSN 2168-6750
  Contributo su Rivista
• An, G.; Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo (2017)
  On the detection of board delay faults through the execution of functional programs. In: 2017 18th IEEE Latin American Test Symposium (LATS), Bogota (CO), 13-15 March 2017, pp. 1-6. ISBN: 978-1-5386-0415-1
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Cetrulo, E.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; ... (2017)
  Automated Test Program Reordering for Efficient SBST. In: Design of Circuits and Integrated Systems Conference (DCIS2017), Barcelona, 22-24 November 2017, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, ... (2017)
  On the Optimization of SBST Test Program Compaction. In: IEEE International Symposium On Defect And Fault Tolerance In VLSI And Nanotechnology Systems (DFTS), Cambridge (UK), October 23-25, 2017, pp. 1-4
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo (2017)
  New techniques for functional testing of microprocessor based systems. relatore: Sanchez E., 29. XXIX Ciclo, P.: 213
  Doctoral Thesis
• Cantoro, Riccardo; Palena, Marco; Pasini, Paolo; SONZA REORDA, Matteo (2016)
  Test Time Minimization in Reconfigurable Scan Networks. In: 2016 IEEE 25th Asian Test Symposium (ATS), Hiroshima (JP), November 21-24, 2016
  Contributo in Atti di Convegno (Proceeding)
• Riefert, Andreas; Cantoro, Riccardo; Sauer, Matthias; SONZA REORDA, Matteo; Becker, Bernd (2016)
  A Flexible Framework for the Automatic Generation of SBST Programs. In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, pp. 1-12. ISSN 1063-8210
  Contributo su Rivista
• Riefert, Andreas; Cantoro, Riccardo; Sauer, Matthias; SONZA REORDA, Matteo; Becker, Bernd (2016)
  Effective generation and evaluation of diagnostic SBST programs. In: 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas (USA), 25-27 April 2016, pp. 1-6. ISBN: 9781467384544
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Piumatti, Davide; Bernardi, Paolo; De Luca, S.; Sansonetti, A. (2016)
  In-field functional test programs development flow for embedded FPUs. In: 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Storrs (USA), 19-20 Sept. 2016, pp. 107-110. ISBN: 978-1-5090-3623-3
  Contributo in Atti di Convegno (Proceeding)
• Alt, J.; Bernardi, Paolo; Bosio, A.; Cantoro, Riccardo; Kerkhoff, H.; Leininger, A.; ... (2016)
  Thermal issues in test: An overview of the significant aspects and industrial practice. In: 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas (USA), 25-27 April 2016, pp. 1-4. ISBN: 9781467384544
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Montazeri, M.; SONZA REORDA, Matteo; Zadegan, F. Ghani; Larsson, E. (2016)
  On the diagnostic analysis of IEEE 1687 networks. In: 2016 21th IEEE European Test Symposium (ETS), pp. 1-2. ISBN: 978-1-4673-9659-2
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Montazeri, M.; SONZA REORDA, Matteo; Zadegan, F. Ghani; Larsson, E. (2016)
  Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks. In: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, pp. 167-172. ISBN: 978-1-5090-1507-8
  Contributo in Atti di Convegno (Proceeding)
• Perez Acle, Julio; Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, ... (2016)
  Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 47, pp. 392-403. ISSN 0141-9331
  Contributo su Rivista
• Tšertov, Anton; Jutman, Artur; Devadze, Sergei; SONZA REORDA, Matteo; Larsson, Erik; ... (2016)
  A Suite of IEEE 1687 Benchmark Networks. In: 2016 IEEE International Test Conference (ITC), Fort Worth, TX (USA), November 15-17, 2016
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; ... (2016)
  Development Flow for On-Line Core Self-Test of Automotive Microcontrollers. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 65, pp. 744-754. ISSN 0018-9340
  Contributo su Rivista
• Bernardi, Paolo; Bovi, C.; Cantoro, Riccardo; De Luca, S.; Meregalli, R.; Piumatti, ... (2015)
  Software-based self-test techniques of computational modules in dual issue embedded processors. In: 2015 20th IEEE European Test Symposium (ETS), Cluj-Napoca, 25-29 May 2015, pp. 1-2. ISBN: 978-1-4799-7603-4
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Montazeri, Mehrdad; SONZA REORDA, Matteo; Ghani Zadegan, Farrokh; ... (2015)
  On the Testability of IEEE 1687 Networks. In: 24th IEEE Asian Test Symposium, Mumbai (IN), November 22-25, 2015, pp. 211-216
  Contributo in Atti di Convegno (Proceeding)
• Perez Acle, Julio; Cantoro, Riccardo; Hailemichael, Abel Teklu; SANCHEZ SANCHEZ, EDGAR ... (2015)
  Observability solutions for in-field functional test of processor-based systems. In: XXX Conference on Design of Circuits and Integrated Systems (DCIS), Estoril (PT), November 25-27, 2015, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Gaudesi, Marco; SANCHEZ SANCHEZ, Edgar Ernesto; Squillero, Giovanni (2015)
  Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs. In: Genetic and Evolutionary Computation Conference 2015 (GECCO), Madrid (ESP), July 11-15, 2015, pp. 1465-1466. ISBN: 9781450334884
  Contributo in Atti di Convegno (Proceeding)