System-Level-Test techniques for Automotive SoCs

• premio semifinale E. J. McCluskey Best Doctoral Thesis 2025 dell'IEEE TTTC per la tesi di dottorato (2025)
• Phd award document (2024)
• Phd award document 2025 (2025)

Master of Science

• Architetture dei sistemi di elaborazione. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Computer architectures. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

• Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; ... (2025)
  A System-Level Test Methodology for Communication Peripherals in System-on-Chips. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 731-739. ISSN 0018-9340
  Contributo su Rivista
• Angione, Francesco; Bernardi, Paolo; Bertani, Claudia; Bertetto, Lorenzo; Cardone, ... (2025)
  Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs. In: Latin American Test Symposium, San Andres Islas, Colombia, 11-14 March 2025, pp. 1-6. ISBN: 978-1-6654-7763-5
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Sinha, Arani (2025)
  From Structural Test Escapes to Silent Data Errors: A preliminary analysis. In: 2025 IEEE 9th International Test Conference India (ITC India), Bangalore (IND), 20-22 July 2025. ISBN: 979-8-3315-0129-7
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco (2025)
  System-Level Test techniques for Automotive SoCs. relatore: BERNARDI, PAOLO; CANTORO, RICCARDO; , 37. XXXVII Ciclo, P.: 222
  Doctoral Thesis
• Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
  Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 3195-3209. ISSN 0018-9340
  Contributo su Rivista
• Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; ... (2025)
  Special Session: Trustworthy Hardware-AI at the Cloud. In: IEEE VLSI Test Symposium 2025, Tempe, Arizona (USA), 28-30 April 2025. ISBN: 979-8-3315-2144-8
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; ... (2025)
  A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs. In: IEEE TRANSACTIONS ON COMPUTERS, pp. 1-13. ISSN 0018-9340
  Contributo su Rivista
• Di Gruttola Giardino, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; ... (2024)
  A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), Didcot (UK), 08-10 October 2024. ISBN: 979-8-3503-6688-4
  Contributo in Atti di Convegno (Proceeding)
• Schwachhofer, D.; Angione, F.; Becker, S.; Wagner, S.; Sauer, M.; Bernardi, P.; Polian, ... (2024)
  Optimizing System-Level Test Program Generation via Genetic Programming. In: 2024 IEEE European Test Symposium (ETS), The Hague (NL), 20-24 May 2024. ISBN: 979-8-3503-4932-0
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; ... (2023)
  A guided debugger-based fault injection methodology for assessing functional test programs. In: VLSI Test Symposium, San Diego (USA), 24-26 April 2023, pp. 1-7. ISBN: 979-8-3503-4630-5
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, ... (2023)
  A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress. In: IEEE TRANSACTIONS ON COMPUTERS, pp. 1447-1459. ISSN 0018-9340
  Contributo su Rivista
• Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; ... (2023)
  On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. In: Latin American Test Symposium, Veracruz (Mexico), 21-24 March 2023, pp. 1-6. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; ... (2023)
  A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips. In: IEEE ACCESS, vol. 11, pp. 105655-105676. ISSN 2169-3536
  Contributo su Rivista
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA ... (2022)
  Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin (USA), 19-21 October 2022
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, ... (2022)
  An innovative Strategy to Quickly Grade Functional Test Programs. In: International Test Conference, Anaheim, CA (USA), 23-30 September 2022, pp. 355-364
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (2022)
  An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, ... (2022)
  A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. In: Latin American Test Symposium, Montevideo (Uruguay), 05-08 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De ... (2022)
  Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (ESP), 23-27 May 2022. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)