Towards Ultra-Reliable Automotive Systems-on-Chip

Bachelor of Science

• Computer sciences. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2023/24, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2024/25, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

• Ciullo, Alessandro; Eggersglüß, Stephan; Tille, Daniel; Glowatz, Andreas; Iaria, Giusy; ... (2025)
  Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG. In: IEEE International Test Conference ASIA 2025, Tokyo (JPN), December 16–19, 2025, pp. 72-77. ISBN: 979-8-3315-7193-1
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
  Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 3195-3209. ISSN 0018-9340
  Contributo su Rivista
• Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; ... (2025)
  A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 1278-1292. ISSN 0018-9340
  Contributo su Rivista
• Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
  Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs. In: 2025 IEEE Latin American Test Symposium, San Andres Islas (COL), 11-14 March 2025. ISBN: 978-1-6654-7763-5
  Contributo in Atti di Convegno (Proceeding)
• Iaria, Giusy (2025)
  Towards Ultra-Reliable Automotive Systems-on-Chip. relatore: BERNARDI, PAOLO; , 37. XXXVII Ciclo, P.: 125
  Doctoral Thesis
• Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2024)
  Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips. In: ELECTRONICS, vol. 13. ISSN 2079-9292
  Contributo su Rivista
• Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; ... (2023)
  About the correlation between logical identified faulty gates and their layout characteristics. In: IEEE International Symposium on On-Line Testing and Robust System Design, 03-05 July 2023, Crete, Greece. ISBN: 979-8-3503-4135-5
  Contributo in Atti di Convegno (Proceeding)
• Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; ... (2022)
  A novel SEU injection setup for Automotive SoC. In: 2022 IEEE International Symposium on Industrial Electronics, Anchorage, AK (USA), 01-03 June 2022, pp. 623-626. ISBN: 978-1-6654-8240-0
  Contributo in Atti di Convegno (Proceeding)
• Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V. (2022)
  In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. In: 2022 IEEE International Test Conference (ITC), Anaheim (USA), 23-30 September 2022, pp. 646-649
  Contributo in Atti di Convegno (Proceeding)
• Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, ... (2022)
  A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. In: Latin American Test Symposium, Montevideo (Uruguay), 05-08 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)