Ph.D. in Ingegneria Informatica E Dei Sistemi , 37th cycle (2021-2024)
Ph.D. obtained in 2025
Dissertation:
Towards Ultra-Reliable Automotive Systems-on-Chip (Abstract)
Tutors:
Paolo Bernardi
Research presentation:
PosterProfile
Research topic
Towards Ultra-Reliable Automotive Systems-on-Chip
Research interests
Biography
Teaching
Teachings
Bachelor of Science
- Computer sciences. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2023/24, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2024/25, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
Research
Research groups
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 3195-3209. ISSN 0018-9340
Contributo su Rivista - Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; ... (2025)
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 1278-1292. ISSN 0018-9340
Contributo su Rivista - Iaria, Giusy (2025)
Towards Ultra-Reliable Automotive Systems-on-Chip. relatore: BERNARDI, PAOLO; , 37. XXXVII Ciclo, P.: 125
Doctoral Thesis - Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs. In: 2025 IEEE Latin American Test Symposium, San Andres Islas (COL), 11-14 March 2025. ISBN: 978-1-6654-7763-5
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2024)
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips. In: ELECTRONICS, vol. 13. ISSN 2079-9292
Contributo su Rivista - Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; ... (2023)
About the correlation between logical identified faulty gates and their layout characteristics. In: IEEE International Symposium on On-Line Testing and Robust System Design, 03-05 July 2023, Crete, Greece. ISBN: 979-8-3503-4135-5
Contributo in Atti di Convegno (Proceeding) - Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Contributo in Atti di Convegno (Proceeding) - Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; ... (2022)
A novel SEU injection setup for Automotive SoC. In: 2022 IEEE International Symposium on Industrial Electronics, Anchorage, AK (USA), 01-03 June 2022, pp. 623-626. ISBN: 978-1-6654-8240-0
Contributo in Atti di Convegno (Proceeding) - Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V. (2022)
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. In: 2022 IEEE International Test Conference (ITC), Anaheim (USA), 23-30 September 2022, pp. 646-649
Contributo in Atti di Convegno (Proceeding) - Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, ... (2022)
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. In: Latin American Test Symposium, Montevideo (Uruguay), 05-08 September 2022
Contributo in Atti di Convegno (Proceeding)