Ph.D. in Ingegneria Informatica E Dei Sistemi , 33rd cycle (2017-2020)
Ph.D. obtained in 2021
Dissertation:
Self-Test Mechanisms for Automotive Multi-Processor System-on-Chips (Abstract)
Tutors:
Edgar Ernesto Sanchez SanchezProfile
Research topic
Self-test mechanisms for Automotive Multi-Processor System-on-Chips
Research interests
Biography
Awards and Honors
Teaching
Teachings
Master of Science
- Architetture dei sistemi di elaborazione. A.A. 2019/20, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
- Architetture dei sistemi di elaborazione. A.A. 2020/21, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Bachelor of Science
- Computer sciences. A.A. 2018/19, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Floridia, Andrea (2021)
Self-Test Mechanisms for Automotive Multi-Processor System-on-Chips. relatore: SANCHEZ SANCHEZ, EDGAR ERNESTO; , 33. XXXIII Ciclo, P.: 134
Doctoral Thesis - Floridia, Andrea; Sanchez, Ernesto (2020)
On-line Self-test Mechanism for Dual-Core Lockstep System-on-Chips. In: MICROELECTRONICS RELIABILITY, vol. 112C, pp. 1-10. ISSN 0026-2714
Contributo su Rivista - Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; ... (2020)
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips. In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9-13 March, 2020, pp. 1235-1240. ISBN: 978-3-9819263-4-7
Contributo in Atti di Convegno (Proceeding) - Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo (2019)
Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications. In: IEEE ACCESS, vol. 7, pp. 63578-63587. ISSN 2169-3536
Contributo su Rivista - Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De ... (2019)
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips. In: 2019 IEEE International Test Conference (ITC), Washington (USA), 9 - 15 November, 2019, pp. 1-10. ISBN: 978-1-7281-4823-6
Contributo in Atti di Convegno (Proceeding)