Self-test mechanisms for Automotive Multi-Processor System-on-Chips

• P.h.D forum competition held in Baden-Baden (Germany), during the 24th IEEE European Test Symposium. Further info: https://www.testgroup.polito.it/ets19/phd-forum/ The work I presented was ranked as the 2nd best work among the attendees (13 P.h.D. students in total). (2019)

Corso di laurea magistrale

• Architetture dei sistemi di elaborazione. A.A. 2019/20, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2020/21, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Corso di laurea di 1° livello

• Computer sciences. A.A. 2018/19, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso

• Floridia, Andrea (2021)
  Self-Test Mechanisms for Automotive Multi-Processor System-on-Chips. relatore: SANCHEZ SANCHEZ, EDGAR ERNESTO; , 33. XXXIII Ciclo, P.: 134
  Doctoral Thesis
• Floridia, Andrea; Sanchez, Ernesto (2020)
  On-line Self-test Mechanism for Dual-Core Lockstep System-on-Chips. In: MICROELECTRONICS RELIABILITY, vol. 112C, pp. 1-10. ISSN 0026-2714
  Contributo su Rivista
• Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; ... (2020)
  Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips. In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9-13 March, 2020, pp. 1235-1240. ISBN: 978-3-9819263-4-7
  Contributo in Atti di Convegno (Proceeding)
• Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo (2019)
  Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications. In: IEEE ACCESS, vol. 7, pp. 63578-63587. ISSN 2169-3536
  Contributo su Rivista
• Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De ... (2019)
  A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips. In: 2019 IEEE International Test Conference (ITC), Washington (USA), 9 - 15 November, 2019, pp. 1-10. ISBN: 978-1-7281-4823-6
  Contributo in Atti di Convegno (Proceeding)