Alberto Bosio

Ph.D. in Ingegneria Informatica E Dei Sistemi , 18th cycle (2003-2005)

Ph.D. obtained in 2006

Dissertation:

Dependable Architectures for Safety-Critical Applications.

Tutors:

Paolo Ernesto Prinetto

Publications

Works published during the Ph.D. View all publications in Porto@Iris

  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
    Automatic March tests generation for multi-port SRAMs. In: IEEE 3rd International Workshop on Electronic Design, Test and Applications (DELTA), Kuala Lumpur, MY, 17-19 Jan. 2006, pp. 385-392. ISBN: 0769525008
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
    A 22n March Test for Realistic Static Linked Faults in SRAMs. In: IEEE 11th European Test Symposium (ETS), SouthAmpton, UK, 21-24 May 2006, pp. 49-54
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
    Automatic March Tests Generations for Static Linked Faults in SRAMs. In: Design, Automation and Test in Europe, Conference and Exhibition (DATE), Munich, DE, 6-10 Mar. 2006, pp. 1-6. ISBN: 3981080114
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
    Memory Fault Simulator for Static-Linked Faults. In: IEEE 15th AsianTest Symposium (ATS), Fukuoka, JP, 20-23 Nov. 2006, pp. 31-36. ISBN: 0769526284
    Contributo in Atti di Convegno (Proceeding)
  • Fischerova, M.; Pikula, T.; Simlastik, M.; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, ... (2006)
    A tool for teaching memory testing based on BIST. In: IEEE International Biennal Baltic Electronics Conference (BEC), Tallin, EE, 2-4 Oct. 2006, pp. 187-190. ISBN: 1424404142
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
    A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. In: IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Prague, CZ, 18-21 Apr. 2006, pp. 155-156
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
    ATPG for Dynamic Burn-In Test in Full-Scan Circuits. In: IEEE 15th Asian Test Symposium (ATS), Fukuoka, JP, 20-23 Nov. 2006, pp. 75-82
    Contributo in Atti di Convegno (Proceeding)
  • Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Fisherova, M.; Pikula, T.; ... (2006)
    Interactive Educational Tool for Memory Testing. In: 6th International Workshop on Microelectronic Education, Stockholm, SE, 8-9 Jun. 2006, pp. 100-103. ISBN: 9171784020
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2005)
    March AB, March AB1: new March tests for unlinked dynamic memory faults. In: IEEE International Test Conference (ITC), Austin (TX), USA, 8-10 Nov. 2005, pp. 834-841
    Contributo in Atti di Convegno (Proceeding)
  • Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2005)
    Automatic March tests generation for static and dynamic faults in SRAMs. In: IEEE 10th European Test Symposium (ETS), Tallin, EE, 22-25 May 2005, pp. 122-127
    Contributo in Atti di Convegno (Proceeding)
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