Ph.D. in Ingegneria Informatica E Dei Sistemi , 36th cycle (2020-2023)
Ph.D. obtained in 2024
Dissertation:
New techniques for quality and reliability enhancement in electronic systems (Abstract)
Tutors:
Matteo Sonza Reorda Michelangelo Grosso Ioannis Deretzis
Research presentation:
PosterProfile
Research topic
New strategies for quality and reliability improvement in electronics systems.
Research interests
Biography
He has worked as a physical design engineer at STMicroelectronics since 2019.
In 2020 he started a joint industrial PhD program with Politecnico di Torino and Consiglio Nazionale delle Ricerche (CNR).
His research interests include test and reliability of digital integrated circuits and optimization of physical design flows.
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Mirabella, Nunzio (2024)
New techniques for quality and reliability enhancement in electronic systems. relatore: SONZA REORDA, MATTEO; GROSSO, MICHELANGELO; , 36. XXXVI Ciclo, P.: 103
Doctoral Thesis - Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2023)
Targeting different defect-oriented fault models in IC testing: an experimental approach. In: 26th Euromicro Conference Series on Digital System Design (DSD), Golem (ALB), 6-8 September, 2023, pp. 214-219. ISBN: 979-8-3503-4419-6
Contributo in Atti di Convegno (Proceeding) - Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
Contributo in Atti di Convegno (Proceeding) - Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Contributo su Rivista - Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2022)
A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
Contributo in Atti di Convegno (Proceeding) - Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120 (114100). ISSN 0026-2714
Contributo su Rivista - Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; ... (2021)
Comparing different solutions for testing resistive defects in low-power SRAMs. In: 22nd IEEE Latin-American Test Symposium 2021, Porto Alegre (Brazil), 27th - 29th October 2021, pp. 1-6
Contributo in Atti di Convegno (Proceeding) - Mirabella, N.; Ricci, M.; Grosso, M. (2020)
On the test of single via related defects in digital VLSI designs. In: 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020, Serbia, 2020, pp. 1-6. ISBN: 978-1-7281-9938-2
Contributo in Atti di Convegno (Proceeding)