
Ph.D. in Ingegneria Informatica E Dei Sistemi , 36th cycle (2020-2023)
Ph.D. obtained in 2024
Dissertation:
Formal Methods for Test and Reliability (Abstract)
Tutors:
Matteo Sonza Reorda Riccardo CantoroProfile
Research topic
Test and Validations of Complex Circuits via Stress Test
Research interests
Biography
Awards and Honors
Teaching
Teachings
Master of Science
- Testing and fault tolerance. A.A. 2021/22, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
- Testing and fault tolerance. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
- Testing and fault tolerance. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Bachelor of Science
- Computer sciences. A.A. 2021/22, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2021/22, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D. (2024)
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults. In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Kielce (POL), 03-05 April 2024, pp. 124-129. ISBN: 979-8-3503-5934-3
Contributo in Atti di Convegno (Proceeding) - Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, ... (2024)
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects. In: International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes (FRA), 03-05 July 2024. ISBN: 979-8-3503-7055-3
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos (2024)
Formal Methods for Test and Reliability. relatore: SONZA REORDA, MATTEO; CANTORO, RICCARDO; , 36. XXXVI Ciclo, P.: 168
Doctoral Thesis - Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo (2023)
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 98. ISSN 0141-9331
Contributo su Rivista - Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; ... (2023)
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. In: 2023 IEEE European Test Symposium (ETS), Venice (Italy), 22-26 May 2023, pp. 1-10. ISBN: 979-8-3503-3634-4
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; ... (2023)
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. In: 2023 IEEE European Test Symposium (ETS), Venice (Italy), 22-26 May 2023, pp. 1-5. ISBN: 979-8-3503-3634-4
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; ... (2023)
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT. In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, vol. 42, pp. 4270-4281. ISSN 0278-0070
Contributo su Rivista - Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, ... (2023)
Constraint-Based Automatic SBST Generation for RISC-V Processor Families. In: 2023 IEEE European Test Symposium (ETS), Venice (Italy), 22-26 May 2023, pp. 1-6. ISBN: 979-8-3503-3634-4
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; ... (2023)
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors. In: Asian Test Symposium (ATS), Beijing (China), 14-17 October 2023, pp. 1-6. ISBN: 979-8-3503-0310-0
Contributo in Atti di Convegno (Proceeding) - Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA ... (2023)
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters. In: ISC High Performance 2023 International Workshops, Hamburg (DEU), May 21–25, 2023, pp. 444-457. ISSN 1611-3349. ISBN: 978-3-031-40842-7
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Faller, Tobias; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Cantoro, ... (2022)
Using Formal Methods to Support the Development of STLs for GPUs. In: Asian Test Symposium (ATS), Taiwan, 21-24 November 2022, pp. 84-89
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; ... (2022)
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms. In: Dependable Systems and Networks, 27-30 June 2022, pp. 23-24
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; ... (2021)
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks. In: IEEE ACCESS, vol. 9, pp. 155998-156012. ISSN 2169-3536
Contributo su Rivista - Deligiannis, Nikolaos; Cantoro, Riccardo; Faller, Tobias; Paxian, Tobias; Becker, Bernd; ... (2021)
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor. In: Asian Test Symposium (ATS), 22-25 Nov. 2021, pp. 73-78
Contributo in Atti di Convegno (Proceeding) - Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo (2021)
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques. In: Digital System Design (DSD), 01-03 September 2021, pp. 535-540. ISBN: 978-1-6654-2703-6
Contributo in Atti di Convegno (Proceeding) - Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; ... (2020)
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network. In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp. 1-4. ISBN: 978-1-7281-9457-8
Contributo in Atti di Convegno (Proceeding) - Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E. (2020)
Evaluating the Code Encryption Effects on Memory Fault Resilience. In: 21st IEEE Latin-American Test Symposium, LATS 2020, Maceio, Brazil, 30 March-2 April 2020, pp. 1-6. ISBN: 978-1-7281-8731-0
Contributo in Atti di Convegno (Proceeding)