Ph.D. in Ingegneria Elettrica, Elettronica E Delle Comunicazioni , 31st cycle (2015-2018)
Ph.D. obtained in 2019
Dissertation:
Resistive switching in ALD metal-oxides with engineered interfaces (Abstract)
Tutors:
Carlo Ricciardi Candido PirriPublications
Works published during the Ph.D. View all publications in Porto@Iris
- Conti, Daniele; Laurenti, Marco; Porro, Samuele; Giovinazzo, Cecilia; Bianco, Stefano; ... (2019)
Resistive Switching in Sub-micrometric ZnO polycrystalline Films. In: NANOTECHNOLOGY, vol. 30. ISSN 0957-4484
Contributo su Rivista - Boybat, I.; Giovinazzo, C.; Shahrabi, E.; Krawczuk, I.; Giannopoulos, I.; Piveteau, C.; ... (2019)
Multi-ReRAM synapses for artificial neural network training. In: 2019 IEEE International Symposium on Circuits and Systems (ISCAS), pp. 1-5. ISBN: 978-1-7281-0397-6
Contributo in Atti di Convegno (Proceeding) - Giovinazzo, Cecilia; Sandrini, Jury; Shahrabi, Elmira; Celik, Oguz Tolga; Leblebici, ... (2019)
Analog Control of Retainable Resistance Multistates in HfO2 Resistive-Switching Random Access Memories (ReRAMs). In: ACS APPLIED ELECTRONIC MATERIALS, vol. 1, pp. 900-909. ISSN 2637-6113
Contributo su Rivista - Giovinazzo, Cecilia (2019)
Resistive switching in ALD metal-oxides with engineered interfaces. relatore: RICCIARDI, CARLO; PIRRI, Candido; , 31. XXXI Ciclo, P.: 182
Doctoral Thesis - Shahrabi, E.; Giovinazzo, C.; Hadad, M.; Lagrange, T.; Ramos, M.; Ricciardi, C.; ... (2019)
Switching Kinetics Control of W-Based ReRAM Cells in Transient Operation by Interface Engineering. In: ADVANCED ELECTRONIC MATERIALS, vol. 5. ISSN 2199-160X
Contributo su Rivista - Giovinazzo, C.; Ricciardi, C.; Pirri, C. F.; Chiolerio, A.; Porro, S. (2018)
Effects of single-pulse Al2O3 insertion in TiO2 oxide memristors by low temperature ALD. In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING, vol. 124. ISSN 0947-8396
Contributo su Rivista - Shahrabi, Elmira; Giovinazzo, Cecilia; Sandrini, Jury; Leblebici, Yusuf (2018)
The key impact of incorporated Al2O3barrier layer on W-based ReRAM switching performance. In: 14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018, cze, 2018, pp. 69-72. ISBN: 9781538653869
Contributo in Atti di Convegno (Proceeding) - Calvo, D.; De Remigis, P.; Giovinazzo, Cecilia; Mazza, G.; Olave, ELIAS JONHATAN; ... (2015)
Tests of SEU effects of circuits developed in 130 nm CMOS technology. In: LNL- ANNUAL REPORT, vol. LNL Annual Report 2015, pp. 115-116. ISSN 1828-8561
Contributo su Rivista