
Ph.D. in Ingegneria Elettrica, Elettronica E Delle Comunicazioni , 33rd cycle (2017-2020)
Ph.D. obtained in 2021
Dissertation:
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices (Abstract)
Tutors:
Candido Pirri Sergio FerreroProfile
Research topic
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices
Research interests
Biography
at the Polytechnic of Turin, and his research has been carried on with the funding and collaboration of Vishay Intertechnology Inc.
He completed a bachelor degree in "Electronic Engineering" at the University of Pisa, followed by a master of science degree at the Polytechnic of Turin
in the class of "Nanotechnologies for the ICTs", for which he obtained a 6 months "Thesis Abroad" scholarship at the internationally recognized
scientific institution of CEA (Grenoble, France) to work on his thesis entitled "Programming Mechanisms of Phase Change Memory Devices Comprising Multiphase Materials"
After completing his master's studies, the student won a research fellowship for which he performed research in collaboration with Vishay Intertechnology Inc., Italy.
His knowledge includes the characterization, modeling, simulation and design of electronic semiconductor devices,
as well as extended experience in advanced failure analysis and enhanced electrical and reliability testing.
Over the years of his activity, the student has been involved in various activities, with the aim of studying the failure mode
the lifetime and reliability performance of power semiconductor devices, by designing and carrying out advanced reliability tests, beyond the levels required by current industry and automotive standards.
During his activities, the student also acquired deep knowledge on the workflow and project management in international industry contexts,
as well as advanced skills regarding the processing, analysis and interpretation of scientific data and teamwork, in a highly transversal multi-team oriented and multi-laboratory environment.
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Cimmino, Davide (2021)
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices. relatore: PIRRI, Candido; FERRERO, SERGIO; , 33. XXXIII Ciclo, P.: 150
Doctoral Thesis - Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; ... (2020)
Multilayer film passivation for enhanced reliability of power semiconductor devices. In: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS, vol. 38. ISSN 2166-2746
Contributo su Rivista - Cimmino, Davide; Ferrero, Sergio (2020)
High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances. In: ELECTRONICS, vol. 9. ISSN 2079-9292
Contributo su Rivista - Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; ... (2019)
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. In: MICROELECTRONICS RELIABILITY, vol. 100-101, pp. 1-5. ISSN 0026-2714
Contributo su Rivista