Ph.D. in Ingegneria Elettrica, Elettronica E Delle Comunicazioni , 30th cycle (2014-2017)
Ph.D. obtained in 2018
Dissertation:
Analisi della variabilità delle prestazioni FinFET AC/RF attraverso simulazioni efficienti basate sulla fisica per l'ottimizzazione degli stadi RF CMOS
Tutors:
Simona Donati Guerrieri Fabrizio BonaniPublications
Works published during the Ph.D. View all publications in Porto@Iris
- Bughio, AHSIN MURTAZA (2018)
Variability analysis of FinFET AC/RF performances through efficient physics-based simulations for the optimization of RF CMOS stages. relatore: DONATI GUERRIERI, SIMONA; BONANI, FABRIZIO; Limiti E., CRUPI G., 30. XXX Ciclo, P.: 158
Doctoral Thesis - Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni (2018)
Variability of FinFET AC parameters: A physics-based insight. In: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, vol. 31. ISSN 0894-3370
Contributo su Rivista - Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni (2017)
Physics-based modeling of FinFET RF variability under Shorted- and Independent-Gates bias. In: Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), Graz, Austria, 20-21 April 2017, pp. 1-4. ISBN: 978-1-5090-5862-4
Contributo in Atti di Convegno (Proceeding) - Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni (2017)
Multi-gate FinFET Mixer Variability assessment through physics-based simulation. In: IEEE ELECTRON DEVICE LETTERS, vol. 38, pp. 1004-1007. ISSN 0741-3106
Contributo su Rivista - Bughio, A. M.; Guerrieri, S. Donati; Bonani, F.; Ghione, G. (2017)
RF sensitivity analysis of independent-gates FinFETs for analog applications exploiting the back-gating effect. In: European Microwave Integrated Circuits Conference, Nuremburg, Germany, 9-10 October, 2017, pp. 256-259. ISBN: 978-2-87487-048-4
Contributo in Atti di Convegno (Proceeding) - Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni (2016)
Physics-based modeling of FinFET RF variability. In: European Microwave Integrated Circuits Conference (EUMIC), London, UK, 3-7 October 2016
Contributo in Atti di Convegno (Proceeding) - Bughio, AHSIN MURTAZA; DONATI GUERRIERI, Simona; Bonani, Fabrizio; Ghione, Giovanni (2016)
Physics-based analysis of FinFET RF variability including parasitics. In: 48th Annual Meeting of the Associazione Gruppo Italiano di Elettronica (GE), Brescia, Italy, June 22 to 24, 2016, pp. 1-1
Contributo in Atti di Convegno (Proceeding)