Affidabilita' nell'elettronica di potenza

Corso di laurea magistrale

• Architetture dei sistemi di elaborazione. A.A. 2019/20, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2020/21, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Corso di laurea di 1° livello

• Informatica. A.A. 2018/19, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2019/20, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2020/21, INGEGNERIA AEROSPAZIALE. Collaboratore del corso

• LABINF - Laboratorio Didattico di Informatica Avanzata

• Piumatti, Davide (2021)
  Reliability in Power Electronics and Power Systems. relatore: SONZA REORDA, MATTEO; , 33. XXXIII Ciclo, P.: 165
  Doctoral Thesis
• Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu (2021)
  Assessing the effectiveness of different test approaches for power devices in a PCB. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 9, pp. 3671-3685. ISSN 2168-6777
  Contributo su Rivista
• Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco (2020)
  Testing Heatsink Faults in Power Transistors by means of Thermal Model. In: 21st IEEE Latin-American Test Symposium (LATS20), Jatiúca (Maceió), Brazil, 30th March - 2nd April 2020, pp. 1-6. ISBN: 978-1-7281-8731-0
  Contributo in Atti di Convegno (Proceeding)
• Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A. (2020)
  An efficient strategy for the development of software test libraries for an automotive microcontroller family. In: MICROELECTRONICS RELIABILITY, vol. 115 (113962). ISSN 0026-2714
  Contributo su Rivista
• Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco (2020)
  Faults Detection in the Heatsinks Mounted on Power Electronic Transistors. In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS, vol. 9, pp. 206-212. ISSN 2319-2518
  Contributo su Rivista
• Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; ... (2020)
  Test Solution for Heatsinks in Power Electronics Applications. In: ELECTRONICS, vol. 9, pp. 1-15. ISSN 2079-9292
  Contributo su Rivista
• Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; ... (2020)
  Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips. In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9-13 March, 2020, pp. 1235-1240. ISBN: 978-3-9819263-4-7
  Contributo in Atti di Convegno (Proceeding)
• Piumatti, Davide; Sini, Jacopo; Borlo, Stefano; Sonza Reorda, Matteo; Bojoi, Radu; ... (2020)
  Multilevel Simulation Methodology for FMECA Study Applied to a Complex Cyber-Physical System. In: ELECTRONICS, vol. 9. ISSN 2079-9292
  Contributo su Rivista
• Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De ... (2019)
  A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips. In: 2019 IEEE International Test Conference (ITC), Washington (USA), 9 - 15 November, 2019, pp. 1-10. ISBN: 978-1-7281-4823-6
  Contributo in Atti di Convegno (Proceeding)
• Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; SONZA REORDA, Matteo; Bojoi, IUSTIN ... (2019)
  Assessing the Effectiveness of the Test of Power Devices at the Board Level. In: 34th IEEE Conference on Design of Circuits and Integrated Systems (DCIS 19), Bilbao, Spain, November 20 – 22, 2019, pp. 1-6. ISBN: 978-1-7281-5458-9
  Contributo in Atti di Convegno (Proceeding)