Manufacturing and In-Field Testing Techniques

Corso di laurea magistrale

• Computer architectures. A.A. 2025/26, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Corso di laurea di 1° livello

• Algoritmi e strutture dati. A.A. 2025/26, INGEGNERIA INFORMATICA. Collaboratore del corso
• Operating systems. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Operating systems. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Sistemi operativi. A.A. 2023/24, INGEGNERIA INFORMATICA. Collaboratore del corso
• Sistemi operativi. A.A. 2024/25, INGEGNERIA INFORMATICA. Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

• Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; ... (2026)
  Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 75, pp. 554-566. ISSN 1557-9956
  Contributo su Rivista
• Filipponi, Gabriele (2026)
  Manufacturing and In-Field Testing Techniques. relatore: BERNARDI, PAOLO; CANTORO, RICCARDO; , 38. XXXVIII Ciclo, P.: 131
  Doctoral Thesis
• Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
  Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs. In: 2025 IEEE Latin American Test Symposium, San Andres Islas (COL), 11-14 March 2025. ISBN: 978-1-6654-7763-5
  Contributo in Atti di Convegno (Proceeding)
• Filipponi, Gabriele (2025)
  FSWGEN: a Device-tree Specification driven System-Level Test workload generator. In: International Test Conference, San Diego (USA), September 21-26, 2025, pp. 558-559. ISBN: 979-8-3315-7041-5
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; ... (2025)
  A System-Level Test Methodology for Communication Peripherals in System-on-Chips. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 731-739. ISSN 0018-9340
  Contributo su Rivista
• Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2024)
  Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips. In: ELECTRONICS, vol. 13. ISSN 2079-9292
  Contributo su Rivista
• Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
  Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, ... (2023)
  Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Tallinn (Estonia), 03-05 May 2023, pp. 21-26. ISBN: 979-8-3503-3277-3
  Contributo in Atti di Convegno (Proceeding)
• Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V. (2022)
  In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. In: 2022 IEEE International Test Conference (ITC), Anaheim (USA), 23-30 September 2022, pp. 646-649
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (2022)
  An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA ... (2022)
  Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin (USA), 19-21 October 2022
  Contributo in Atti di Convegno (Proceeding)