Functional Path Delay Test and Ageing of Integrated Circuits

Corso di laurea magistrale

• Architetture dei sistemi di elaborazione. A.A. 2021/22, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Corso di laurea di 1° livello

• Informatica. A.A. 2020/21, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2022/23, INGEGNERIA GESTIONALE. Collaboratore del corso

• Sartoni, Sandro (2023)
  New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies. relatore: SONZA REORDA, MATTEO; CANTORO, RICCARDO; , 35. XXXV Ciclo, P.: 177
  Doctoral Thesis
• Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, ... (2023)
  Evaluating the Impact of Aging on Path-Delay Self-Test Libraries. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023, Juan-Les-Pins (FRA), 03-05 October 2023. ISBN: 979-8-3503-1500-4
  Contributo in Atti di Convegno (Proceeding)
• Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, ... (2023)
  Self-Test Library Generation for In-field Test of Path Delay faults. In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, vol. 42, pp. 4246-4259. ISSN 0278-0070
  Contributo su Rivista
• da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, ... (2022)
  A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers. In: ELECTRONICS, vol. 11. ISSN 2079-9292
  Contributo su Rivista
• Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, ... (2022)
  Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. In: 2022 IEEE European Test Symposium, Barcelona (SP), 23-27 Maggio 2022, pp. 1-2. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
  Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, ... (2022)
  Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. In: 2022 IEEE 40th VLSI Test Symposium (VTS), San Diego (USA), 25-27 Aprile 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo ... (2021)
  Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement. In: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), 28-30 June 2021, pp. 1-4. ISBN: 978-1-6654-3370-9
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; ... (2020)
  New Perspectives on Core In-field Path Delay Test. In: 2020 IEEE International Test Conference (ITC), Washington DC (USA), 01-06 November 2020, pp. 1-5. ISBN: 978-1-7281-9113-3
  Contributo in Atti di Convegno (Proceeding)
• Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza (2020)
  In-field Functional Test of CAN Bus Controllers. In: IEEE VLSI Test Symposium 2020, pp. 1-6. ISBN: 978-1-7281-5359-9
  Contributo in Atti di Convegno (Proceeding)
• da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; ... (2020)
  Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. In: 2020 IEEE European Test Symposium (ETS), Tallinn, Estonia, 25-29 May 2020, pp. 1-6. ISBN: 978-1-7281-4312-5
  Contributo in Atti di Convegno (Proceeding)