Muhammad Yousuf Zaman

Dottorato in Fisica , 25^o ciclo (2010-2012)

Dottorato concluso nel 2013

Modelling and Characterization of Metal/SiC Interface for Power Device Application.

Zaman, MUHAMMAD YOUSUF (2013)
Modeling and Characterization of Metal/SiC Interface for Power Device Application. relatore: C. Fabrizio Pirri, 25. XXV
Doctoral Thesis
Zaman, MUHAMMAD YOUSUF; Ferrero, Sergio; Perrone, Denis; Scaltrito, Luciano; Shahzad, ... (2013)
Fabrication of Ni/Ti/Al Schottky contact to n-type 4H-SiC under various annealing conditions. In: JOURNAL OF PHYSICS. CONFERENCE SERIES, vol. 439. ISSN 1742-6588
Contributo su Rivista
Zaman, MUHAMMAD YOUSUF; Perrone, Denis; Ferrero, Sergio; Scaltrito, Luciano; Naretto, ... (2012)
Evaluation of correct value of Richardson's constant by analyzing the electrical behavior of three different diodes at different temperatures. In: Materials Science Forum / S.N., S.L., Trans Tech Publications, Switzerland, pp. 174-178
Contributo in Volume
Zaman, MUHAMMAD YOUSUF; Perrone, Denis; Ferrero, Sergio; Scaltrito, Luciano; Naretto, ... (2012)
Barrier inhomogeneities of a medium size Mo/4H-SiC Schottky diode. In: Materials Science Forum / S.N., S.L., Trans Tech Publications, Switzerland, pp. 188-192
Contributo in Volume