ERC sectors

SDG

• EDAA Outstanding Dissertation Award conferred by European Design and Automation Association - EDAA, United kingdom (2006)
• Best Paper Award at the IEEE Conference on Design, Automation and Test in Europe conferred by DATE Program Committee, Italy (2006)
• Best Paper award in DDECS 2016 conferred by DDECS organizing committee, Italy (2016)

• Fellow - IEEE, Stati Uniti (2020-)
  IEEE Senior Member

• Microelectronics Reliability (2021-), Guest Editor of magazine or editorial series

• Test Technology Educational Program - TTEP, Program chair
• Test Technology Educational Program - TTEP, Program chair

• Collegio di Ingegneria Informatica, del Cinema e Meccatronica. Componente

PhD

• Automated digital testing: present and future. A.A. 2018/19, INGEGNERIA INFORMATICA E DEI SISTEMI. Teaching assistant

Master of Science

• Architetture dei sistemi di elaborazione. A.A. 2017/18, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2019/20, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Titolare del corso
• Architetture dei sistemi di elaborazione. A.A. 2020/21, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Titolare del corso
• Architetture dei sistemi di elaborazione. A.A. 2021/22, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Titolare del corso
• Architetture dei sistemi di elaborazione. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Titolare del corso
• Architetture dei sistemi di elaborazione. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Titolare del corso
• Computer architectures. A.A. 2017/18, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Computer architectures. A.A. 2018/19, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Titolare del corso

Bachelor of Science

• Computer sciences. A.A. 2017/18, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Titolare del corso
• Computer sciences. A.A. 2023/24, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Titolare del corso
• Informatica. A.A. 2017/18, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2017/18, INGEGNERIA AEROSPAZIALE. Titolare del corso
• Informatica. A.A. 2018/19, INGEGNERIA AEROSPAZIALE. Titolare del corso
• Informatica. A.A. 2019/20, INGEGNERIA AEROSPAZIALE. Titolare del corso
• Informatica. A.A. 2020/21, INGEGNERIA AEROSPAZIALE. Titolare del corso
• Informatica. A.A. 2021/22, INGEGNERIA AEROSPAZIALE. Titolare del corso

Lecturer of the following courses:
- Architetture dei Sistemi di Elaborazione (1st year Master)
- Computer Science (1st year Bachelor)

• CAD - Electronic CAD & Reliability Group

Projects funded by commercial contracts

• Metodologie per la massimizzazione della stress-coverage mediante applicazione di test strutturali e funzionali in ambiente System Level Test/Burn-In e Utilizzo di test funzionali per ridurre l’over-killing dovuto alle condizioni di , (2023-2024) - Responsabile Scientifico
  Commercial Research
• Study of solutions for internal analog signals measurement and delivery of information across the chip in digital form , (2023-2024) - Responsabile Scientifico
  Commercial Research
• Colored NVM bitmap integration and validation in Aurix3G product family and A3G NVM Read Redundancy Analysis PBIST Concurrent Power Aware BIST Test Strategies enabling Minimal Pincount FE Insertion , (2023-2023) - Responsabile Scientifico
  Commercial Research
• Generazione automatica e algoritmica di stimoli per lo stress (burn-in) di dispositivi SoC , (2022-2023) - Responsabile Scientifico
  Commercial Research
• Colored bitmap integration in Aurix2G including demonstration in production environment and porting support to Aurix3G , (2021-2022) - Responsabile Scientifico
  Commercial Research
• Power Drop Aware NVM Concurrent BIST Test Strategies enabling Minimal Pincount FE Insertion (U-RPC) , (2019-2020) - Responsabile Scientifico
  Commercial Research
• Redundancy repair algorithm definition for A3G ESF3 based on Array Fail Diagnostic and Suspect Learning , (2019-2020) - Responsabile Scientifico
  Commercial Research
• New techniques for supporting the System-Level Test (SLT) phase fors automotive decives , (2019-2020) - Responsabile Scientifico
  Commercial Research
• Portable Repair DfM Approach for A2G/A3G Flash Test , (2019-2019) - Responsabile Scientifico
  Commercial Research
• Zynq MPSoC Ultrascale +(16nm generation) and Versal (7nm generation) , (2019-2020) - Responsabile Scientifico
  Commercial Research
• Zynq MPSoC Ultrascale +(16nm generation) , (2018-2019) - Responsabile Scientifico
  Commercial Research
• Portable Repari DfM Approach for A2G/A3G Flash Test , (2018-2019) - Responsabile Scientifico
  Commercial Research
• Everest and Alto projects , (2017-2018) - Responsabile Scientifico
  Commercial Research
• Concept and Implementation Guidelines for Test Time and Diagnosis – Optimal Usage of Hier-archical Design for Testability Hardware regarding typical Production Test Repair corner case Statistics , (2017-2017) - Responsabile Scientifico
  Commercial Research
• LPD (Low Powder Domain) subystem of the MPSoC device , (2017-2017) - Responsabile Scientifico
  Commercial Research
• LPD (Low Powder Domain) subystem of the MPSoC device , (2016-2017) - Responsabile Scientifico
  Commercial Research
• Assesment and Optimization of Hierarchical CPU-based Test for MultiCore eFlash applying DfT Hardware , (2016-2019) - Responsabile Scientifico
  Commercial Research
• SW BIST implementation for Floating Point Unit of 40nm Automotive Microcontrollers , (2016-2016) - Responsabile Scientifico
  Consulting
• Rinnovo della Convenzione Dipartimentale tra il Politecnico di Torino - Dipartimento di Automatica e Informatica (DAUIN), il Centre National de la Recherche Scientifique (CNRS) e l’Université de Montpellier (UM), riguardante il laboratorio franco-italiano per la ricerca in sistemi integrati hardware-software “LIA LAFISI” , (-2020) - Responsabile Scientifico
  Departmental agreements
• Everest and Alto projects , (-2018) - Responsabile Scientifico
  Commercial Research

• Lorenzo Cardone. Programme in Ingegneria Informatica E Dei Sistemi (cycle 38, 2022-in progress)
• Gabriele Filipponi. Programme in Ingegneria Informatica E Dei Sistemi (cycle 38, 2022-in progress)
• Tommaso Foscale. Programme in Ingegneria Informatica E Dei Sistemi (cycle 38, 2022-in progress)
• Nima Kolahimahmoudi. Programme in Ingegneria Informatica E Dei Sistemi (cycle 38, 2023-in progress)
• Francesco Angione. Programme in Ingegneria Informatica E Dei Sistemi (cycle 37, 2021-in progress)
• Giusy Iaria. Programme in Ingegneria Informatica E Dei Sistemi (cycle 37, 2022-in progress)
• Giorgio Insinga. Programme in Ingegneria Informatica E Dei Sistemi (cycle 37, 2021-in progress)

• Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; ... (In stampa)
  A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips. In: IEEE ACCESS. ISSN 2169-3536
  Contributo su Rivista
• Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; ... (2023)
  On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. In: Latin American Test Symposium, Veracruz (Mexico), 21-24 March 2023, pp. 1-6. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; ... (2023)
  A guided debugger-based fault injection methodology for assessing functional test programs. In: VLSI Test Symposium, San Diego (USA), 24-26 April 2023, pp. 1-7. ISBN: 979-8-3503-4630-5
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, ... (2023)
  Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Tallinn (Estonia), 03-05 May 2023, pp. 21-26. ISBN: 979-8-3503-3277-3
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; ... (2023)
  About the correlation between logical identified faulty gates and their layout characteristics. In: IEEE International Symposium on On-Line Testing and Robust System Design, 03-05 July 2023, Crete, Greece. ISBN: 979-8-3503-4135-5
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
  Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, ... (2023)
  A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress. In: IEEE TRANSACTIONS ON COMPUTERS, pp. 1447-1459. ISSN 0018-9340
  Contributo su Rivista
• Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio (2023)
  A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. In: Conference on Very Large Scale Integration (VLSI-SoC 2023)
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, ... (2022)
  An innovative Strategy to Quickly Grade Functional Test Programs. In: International Test Conference, Anaheim, CA (USA), 23-30 September 2022, pp. 355-364
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA ... (2022)
  Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin (USA), 19-21 October 2022
  Contributo in Atti di Convegno (Proceeding)
• Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, ... (2022)
  A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. In: Latin American Test Symposium, Montevideo (Uruguay), 05-08 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Appello, D.; Bernardi, Paolo; Calabrese, Andrea; Pollaccia, G.; Quer, Stefano; Tancorre, ... (2022)
  Parallel Multithread Analysis of Extremely Large Simulation Traces. In: IEEE ACCESS, vol. 10, pp. 56440-56457. ISSN 2169-3536
  Contributo su Rivista
• Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; ... (2022)
  A novel SEU injection setup for Automotive SoC. In: 2022 IEEE International Symposium on Industrial Electronics, Anchorage, AK (USA), 01-03 June 2022, pp. 623-626. ISBN: 978-1-6654-8240-0
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (2022)
  An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; ... (2022)
  Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (2022)
  Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
  Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S. (2021)
  System-Level Test: State of the Art and Challenges. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, 2021, pp. 1-7. ISBN: 978-1-6654-3370-9
  Contributo in Atti di Convegno (Proceeding)
• Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; ... (2021)
  Industrial best practice: cases of study by automotive chip- makers. In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 06-08 October 2021, pp. 1-6. ISBN: 978-1-6654-1609-2
  Contributo in Atti di Convegno (Proceeding)
• Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, ... (2021)
  Innovative methods for Burn-In related Stress Metrics Computation. In: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 28-30 June 2021, pp. 1-6. ISBN: 978-1-6654-3654-0
  Contributo in Atti di Convegno (Proceeding)
• Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; ... (2021)
  Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. In: 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021, aut, 2021, pp. 69-74. ISBN: 978-1-6654-3595-6
  Contributo in Atti di Convegno (Proceeding)
• Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A. (2020)
  An efficient strategy for the development of software test libraries for an automotive microcontroller family. In: MICROELECTRONICS RELIABILITY, vol. 115. ISSN 0026-2714
  Contributo su Rivista
• Polian, I.; Anders, J.; Becker, S.; Bernardi, P.; Chakrabarty, K.; Elhamawy, N.; Sauer, ... (2020)
  Exploring the Mysteries of System-Level Test. In: 29th IEEE Asian Test Symposium, ATS 2020, mys, 2020, pp. 1-6. ISBN: 978-1-7281-7467-9
  Contributo in Atti di Convegno (Proceeding)
• Calabrese, A.; Bernardi, P.; Littardi, S.; Quer, S. (2020)
  Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. In: International Test Conference 2020 (ITC2020), 3-5 November 2020, pp. 1-1
  Contributo in Atti di Convegno (Proceeding)
• Carbonara, S.; Bernardi, P.; Restifo, M. (2019)
  A hybrid in-field self-test technique for SoCs. In: 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019, grc, 2019, pp. 1-6. ISBN: 978-1-7281-3424-6
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, P.; Bosio, A.; Barbareschi, M. (2018)
  DTIS 2018 foreword. In: 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018, ita, 2018, pp. ix-ix. ISBN: 978-1-5386-5291-6
  Contributo in Atti di Convegno (Proceeding)
• Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernabovi, S.; ... (2014)
  An intra-cell defect grading tool. In: 17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2014, pol, 2014, pp. 298-301. ISBN: 978-1-4799-4558-0
  Contributo in Atti di Convegno (Proceeding)
• Touati, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernardi, ... (2014)
  A comprehensive evaluation of functional programs for power-aware test. In: 23rd IEEE North Atlantic Test Workshop, NATW 2014, Binghamton, NY, usa, 2014, pp. 69-72. ISBN: 978-1-4799-5135-2
  Contributo in Atti di Convegno (Proceeding)
• Ballan, O.; Bernardi, P.; Yazdani, B.; Sanchez, E. (2013)
  A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. In: 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013, Chania, Crete, grc, 2013, pp. 79-84. ISBN: 978-1-4799-0664-2
  Contributo in Atti di Convegno (Proceeding)