New strategies for quality and reliability improvement in electronics systems.

• Mirabella, Nunzio (2024)
  New techniques for quality and reliability enhancement in electronic systems. relatore: SONZA REORDA, MATTEO; GROSSO, MICHELANGELO; , 36. XXXVI Ciclo, P.: 103
  Doctoral Thesis
• Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2023)
  Targeting different defect-oriented fault models in IC testing: an experimental approach. In: 26th Euromicro Conference Series on Digital System Design (DSD), Golem (ALB), 6-8 September, 2023, pp. 214-219. ISBN: 979-8-3503-4419-6
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
  An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
  Contributo su Rivista
• Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
  Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2022)
  A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
  Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120 (114100). ISSN 0026-2714
  Contributo su Rivista
• Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; ... (2021)
  Comparing different solutions for testing resistive defects in low-power SRAMs. In: 22nd IEEE Latin-American Test Symposium 2021, Porto Alegre (Brazil), 27th - 29th October 2021, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, N.; Ricci, M.; Grosso, M. (2020)
  On the test of single via related defects in digital VLSI designs. In: 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020, Serbia, 2020, pp. 1-6. ISBN: 978-1-7281-9938-2
  Contributo in Atti di Convegno (Proceeding)