Giorgio Insinga

Ph.D. in Ingegneria Informatica E Dei Sistemi , 37^th cycle (2021-2024)

Ph.D. obtained in 2025

Profile

Research topic

Test and diagnosis of memories embedded in Automotive SoC

Research interests

Computer architectures and Computer aided design

Biography

Giorgio Insinga received his master's degree in Electronics Engineering at Politecnico di Torino in 2021. He is a Ph.D. student in computer science under the supervision of professor Paolo Bernardi. His primary research focuses on the test and reliability of Automotive Systems-on-Chip and their embedded memories.

Awards and Honors

Terzo posto come miglior poster a SERESSA 2023 (2023)
Nel team vincitore del Makeathon Infineon svoltosi a Novembre. Il team ha sviluppato un sensore ultra-low power autoalimentato in 24 ore. Il premio include un voucher da usare per un social event di gruppo. (2022)

Teaching

Teachings

Master of Science

Architetture dei sistemi di elaborazione. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Architetture dei sistemi di elaborazione. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Architetture dei sistemi di elaborazione. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Computer architectures. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

MostraNascondi A.A. passati

Research

Research groups

CAD - Electronic CAD & Reliability Group

Publications

Works published during the Ph.D. View all publications in Porto@Iris

Insinga, Giorgio (2025)
Test and diagnosis of memories embedded in Automotive SoCs. relatore: BERNARDI, PAOLO; CANTORO, RICCARDO; , 37. XXXVII Ciclo, P.: 138
Doctoral Thesis
Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo (2025)
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 118. ISSN 0141-9331
Contributo su Rivista
Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; ... (2024)
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs. In: ELECTRONICS, vol. 13. ISSN 2079-9292
Contributo su Rivista
Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio (2024)
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements. In: IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS), Aix-en-Provence (FR), 14-16 October 2024. ISBN: 979-8-3503-6312-8
Contributo in Atti di Convegno (Proceeding)
Insinga, Giorgio; Battilana, Matteo; Coppetta, Matteo; Mautone, Nellina; Carnevale, ... (2023)
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. In: European Test Symposium (ETS) 2023, Venice (IT), 22-26 May 2023, pp. 1-6. ISBN: 979-8-3503-3634-4
Contributo in Atti di Convegno (Proceeding)
Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio (2023)
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. In: Conference on Very Large Scale Integration (VLSI-SoC 2023), Dubai (United Arab Emirates), October 16 - 18, 2023, pp. 1-6. ISBN: 979-8-3503-2599-7
Contributo in Atti di Convegno (Proceeding)
Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
Contributo in Atti di Convegno (Proceeding)
Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
Contributo in Atti di Convegno (Proceeding)
Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; ... (2022)
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
Contributo in Atti di Convegno (Proceeding)
Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; ... (2021)
Industrial best practice: cases of study by automotive chip- makers. In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 06-08 October 2021, pp. 1-6. ISBN: 978-1-6654-1609-2
Contributo in Atti di Convegno (Proceeding)

More publicationsLess publications

Society and Enterprise

Patents and other intellectual properties

Software analisi qualità schede elettroniche. national Patent
Inventors: Paolo Bernardi Giorgio Insinga