Test and diagnosis of memories embedded in Automotive SoC

• Nel team vincitore del Makeathon Infineon svoltosi a Novembre. Il team ha sviluppato un sensore ultra-low power autoalimentato in 24 ore. Il premio include un voucher da usare per un social event di gruppo. (2022)
• Terzo posto come miglior poster a SERESSA 2023 (2023)

Master of Science

• Architetture dei sistemi di elaborazione. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Computer architectures. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

• Insinga, Giorgio (2025)
  Test and diagnosis of memories embedded in Automotive SoCs. relatore: BERNARDI, PAOLO; CANTORO, RICCARDO; , 37. XXXVII Ciclo, P.: 138
  Doctoral Thesis
• Insinga, Giorgio; Anzoino, Francesco; Bella, Pietro; Bernardi, Paolo; Filippetti, Luca; ... (2025)
  ARBoard: Augmented Reality for PCB Operations in Industry 5.0. In: 2025 IEEE International Symposium on Emerging Metaverse (ISEMV), Honolulu, HI (USA), 19-20 October 2025. ISBN: 979-8-3315-4890-2
  Contributo in Atti di Convegno (Proceeding)
• Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo (2025)
  Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 118. ISSN 0141-9331
  Contributo su Rivista
• Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio (2024)
  A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements. In: IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS), Aix-en-Provence (FR), 14-16 October 2024. ISBN: 979-8-3503-6312-8
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; ... (2024)
  Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs. In: ELECTRONICS, vol. 13. ISSN 2079-9292
  Contributo su Rivista
• Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
  Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Insinga, Giorgio; Battilana, Matteo; Coppetta, Matteo; Mautone, Nellina; Carnevale, ... (2023)
  Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. In: European Test Symposium (ETS) 2023, Venice (IT), 22-26 May 2023, pp. 1-6. ISBN: 979-8-3503-3634-4
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio (2023)
  A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. In: Conference on Very Large Scale Integration (VLSI-SoC 2023), Dubai (United Arab Emirates), October 16 - 18, 2023, pp. 1-6. ISBN: 979-8-3503-2599-7
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
  Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; ... (2022)
  Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; ... (2021)
  Industrial best practice: cases of study by automotive chip- makers. In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 06-08 October 2021, pp. 1-6. ISBN: 978-1-6654-1609-2
  Contributo in Atti di Convegno (Proceeding)

• Software analisi qualità schede elettroniche. national and international Patent
  Inventors: Paolo Bernardi Giorgio Insinga