Ph.D. in Ingegneria Informatica E Dei Sistemi , 35th cycle (2019-2022)
Ph.D. obtained in 2023
Dissertation:
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies (Abstract)
Tutors:
Matteo Sonza Reorda Riccardo CantoroProfile
Research topic
Functional Path Delay Test and Ageing of Integrated Circuits
Research interests
Biography
Due to my interest in embedded systems, I then moved to Turin to enroll in the Embedded Systems Course of the Master of Science Degree in Electronic Engineering. There, I specialized in VLSI design and testing. My master thesis consisted in developing a Self Test Library to test an open HW implementation of a CAN Controller.
I'm currently pursuing my PhD in the CAD Group, working on functional testing, mainly targeting Path Delay Faults and how the ageing process influences the testing procedure of such class of faults.
During my studies I've been part of two university associations, the former in Florence, Firenze Race Team, which goal is to design a racing car to compete with other universities. More in detail, I was part of the group that was in charge of converting a manual driving vehicle into an autonomous one.
Once in Turin I joined in late 2017 the Mu Nu Chapter of IEEE-HKN, a local section of a worldwide honor society that promotes excellence among students and professionals in the fields of interest of IEEE. In this association I served as President in the 2018-2019 A.A., Corresponding Secretary in the 2019-2020 A.A., and now I'm in charge of the IT area of said association as well as a part of the global IEEE-HKN Board of Governors as one of the two student governors.
Teaching
Teachings
Master of Science
- Architetture dei sistemi di elaborazione. A.A. 2021/22, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Bachelor of Science
- Informatica. A.A. 2020/21, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
- Informatica. A.A. 2022/23, INGEGNERIA GESTIONALE. Collaboratore del corso
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Sartoni, Sandro (2023)
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies. relatore: SONZA REORDA, MATTEO; CANTORO, RICCARDO; , 35. XXXV Ciclo, P.: 177
Doctoral Thesis - Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
Contributo in Atti di Convegno (Proceeding) - Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, ... (2022)
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. In: 2022 IEEE 40th VLSI Test Symposium (VTS), San Diego (USA), 25-27 Aprile 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
Contributo in Atti di Convegno (Proceeding) - Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, ... (2022)
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. In: 2022 IEEE European Test Symposium, Barcelona (SP), 23-27 Maggio 2022, pp. 1-2. ISBN: 978-1-6654-6706-3
Contributo in Atti di Convegno (Proceeding) - da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, ... (2022)
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Contributo su Rivista - Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo ... (2021)
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement. In: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), 28-30 June 2021, pp. 1-4. ISBN: 978-1-6654-3370-9
Contributo in Atti di Convegno (Proceeding) - Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; ... (2020)
New Perspectives on Core In-field Path Delay Test. In: 2020 IEEE International Test Conference (ITC), Washington DC (USA), 01-06 November 2020, pp. 1-5. ISBN: 978-1-7281-9113-3
Contributo in Atti di Convegno (Proceeding) - da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; ... (2020)
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. In: 2020 IEEE European Test Symposium (ETS), Tallinn, Estonia, 25-29 May 2020, pp. 1-6. ISBN: 978-1-7281-4312-5
Contributo in Atti di Convegno (Proceeding) - Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza (2020)
In-field Functional Test of CAN Bus Controllers. In: IEEE VLSI Test Symposium 2020, pp. 1-6. ISBN: 978-1-7281-5359-9
Contributo in Atti di Convegno (Proceeding)