Reliability and security assessment of modern embedded devices

• Partecipazione alla preselezione del premio “MY RESEARCH IN THREE MINUTES”- PREMIO TIZIANA VITRANO V EDIZIONE (2022)
• Attività di rilevanza industriale e contratti di ricerca. (2022)
• Polito Courses (2022)
• Visiting PhD Student - Ecole Centrale De Lyon, Lyon, France 1/03/2021 - 31/05/2021 (2022)
• Ph.D. Forum Contest Award at the 25th IEEE European Test Symposium with the work titled “Evaluation of Deep Neural Networks Reliability according to their data-type representation”. (2020)
• The Outstanding Student Paper Award at the 33rd IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFT 2020) with the paper titled "A Pipelined Multi-Level Fault Injector for Deep Neural Networks". (2021)
• PitchD Presentation with the title "Artificial Neural Networks Reliability". YouTube: https://www.youtube.com/watch?v=nZVGai_T0PI&ab_channel=IEEEPoliTOStudentBranch (2022)

• Collegio di Ingegneria Informatica, del Cinema e Meccatronica. Componente

Master of Science

• Testing and fault tolerance. A.A. 2019/20, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Testing and fault tolerance. A.A. 2020/21, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Architetture dei sistemi di elaborazione. A.A. 2021/22, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Bachelor of Science

• Computer sciences. A.A. 2019/20, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2019/20, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2020/21, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
• Computer sciences. A.A. 2020/21, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

Projects funded by competitive calls

• REACT - Self-AwaRe NEuromorphic ArChiTectures: Security, Reliability and Energy-Efficiency , (2025-2029) - Componente gruppo di Ricerca
  UE-funded research - HE - Excellent Science - MSCA

Projects funded by commercial contracts

• AURIXTM NVM Test Strategies enabling Minimal Pincount Concurrent FE Insertion for eNVM Reduced test costs and Diagnosis , (2026-2026) - Responsabile Scientifico
  Commercial Research
• TC4xx NVM Test Strategies enabling Minimal Pincount FE Insertion for reduced test costs , (2025-2025) - Responsabile Scientifico
  Commercial Research
• Colored NVM bitmap and repair integration with statistical evaluation in production for Aurix3G product family , (2023-2024) - Responsabile Scientifico
  Commercial Research

• Giacomo Perlo. Programme in Ingegneria Informatica E Dei Sistemi (cycle 41, 2025-in progress)
• Antonio Porsia. Programme in Ingegneria Informatica E Dei Sistemi (cycle 39, 2023-in progress)
  
  Computer architectures and Computer aided design
• Vittorio Turco. Programme in Ingegneria Informatica E Dei Sistemi (cycle 39, 2023-in progress)
  Research subject: Reliability evaluation and hardening of AI accelerators
  
  Controls and system engineering

• Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni (2022)
  Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors. In: APPLIED SOFT COMPUTING, vol. 116, pp. 1-16. ISSN 1568-4946
  Contributo su Rivista
• Ruospo, A. (2022)
  Reliability Assessment Methodologies for ANN-based Systems. In: 23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo (Uruguay), 05-08 September 2022, pp. 1-4. ISBN: 978-1-6654-5707-1
  Contributo in Atti di Convegno (Proceeding)
• Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; ... (2022)
  Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, vol. 10, pp. 1867-1882. ISSN 2168-6750
  Contributo su Rivista
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De ... (2022)
  Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (ESP), 23-27 May 2022. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, ... (2022)
  Selective Hardening of Critical Neurons in Deep Neural Networks. In: 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022, Prague, Czech Republic, April 6 – 8, 2022, pp. 136-141
  Contributo in Atti di Convegno (Proceeding)
• Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, ... (2022)
  Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022), Torino, September, 12th-14th 2022. ISBN: 978-1-6654-7355-2
  Contributo in Atti di Convegno (Proceeding)
• Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, ... (2022)
  Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits. In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O., S.L., Springer Nature, pp. 349-385. ISBN: 978-3-030-94704-0
  Contributo in Volume
• Ruospo, Annachiara (2022)
  Reliability and Security Assessment of Modern Embedded Devices. relatore: SANCHEZ SANCHEZ, EDGAR ERNESTO; , 34. XXXIV Ciclo, P.: 193
  Doctoral Thesis
• Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E. (2021)
  A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, 2021, pp. 1-6. ISBN: 978-1-6654-3370-9
  Contributo in Atti di Convegno (Proceeding)
• Ruospo, Annachiara; Matana Luza, Lucas; Bosio, Alberto; Traiola, Marcello; Dilillo, ... (2021)
  Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks. In: LATS 2021 : IEEE Latin-American Test Symposium, Punta del Este, Uruguay, Oct 27, 2021 - Oct 29, 2021, pp. 1-5
  Contributo in Atti di Convegno (Proceeding)
• Ruospo, Annachiara; Sanchez, Ernesto; Traiola, Marcello; O’Connor, Ian; Bosio, Alberto (2021)
  Investigating data representation for efficient and reliable Convolutional Neural Networks. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 86 (104318). ISSN 0141-9331
  Contributo su Rivista
• Matana Luza, Lucas; Ruospo, Annachiara; Bosio, Alberto; Sanchez, Ernesto; Dilillo, Luigi (2021)
  A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Vienna (Aut), 7-9 April 2021, pp. 41-44. ISBN: 978-1-6654-3595-6
  Contributo in Atti di Convegno (Proceeding)
• Ruospo, Annachiara; Ernesto, Sanchez (2021)
  On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs. In: APPLIED SCIENCES, vol. 11. ISSN 2076-3417
  Contributo su Rivista
• Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni (2021)
  A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores. In: 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Vienna, Austria, April 7-9
  Contributo in Atti di Convegno (Proceeding)
• Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Sanchez, Ernesto (2020)
  A Pipelined Multi-Level Fault Injector for Deep Neural Networks. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Frascati (Ita), October 19 – 21, 2020. ISBN: 978-1-7281-9457-8
  Contributo in Atti di Convegno (Proceeding)
• Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Sanchez, Ernesto (2020)
  Evaluating Convolutional Neural Networks Reliability depending on their Data Representation. In: Euromicro Conference on Digital System Design (DSD) 2020, Kranj (Slo) (virtual event), August 26 – 28, 2020, pp. 672-679. ISBN: 978-1-7281-9535-3
  Contributo in Atti di Convegno (Proceeding)
• Duran, Ckristian; Morales, Hanssel; Rojas, Camilo; Ruospo, Annachiara; Ernesto, Sanchez; ... (2020)
  Simulation and Formal: The Best of Both Domains for Instruction Set Verification of RISC-V Based Processors. In: IEEE International Symposium on Circuits and Systems (ISCAS), Virtual Event, from October 10 to October 21 2020
  Contributo in Atti di Convegno (Proceeding)
• Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; ... (2020)
  Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips. In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9-13 March, 2020, pp. 1235-1240. ISBN: 978-3-9819263-4-7
  Contributo in Atti di Convegno (Proceeding)
• Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; ... (2020)
  Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. In: 38th IEEE VLSI Test Symposium, VTS 2020, usa, 2020, pp. 1-9. ISBN: 978-1-7281-5359-9
  Contributo in Atti di Convegno (Proceeding)

• A Shannon-Hartley-Based Approach To Measure The Criticality Of Synaptic Weights. international Patent
  Inventors: Annachiara Ruospo Edgar Ernesto Sanchez Sanchez