Francesco Angione

Ph.D. in Ingegneria Informatica E Dei Sistemi , 37^th cycle (2021-2024)

Ph.D. obtained in 2025

Profile

Research topic

System-Level-Test techniques for Automotive SoCs

Research interests

Computer architectures and Computer aided design

Controls and system engineering

Software engineering and Mobile computing

Biography

Francesco Angione is a Computer Engineer with an M.Sc. in Embedded Systems track, obtained from Politecnico di Torino in 2020. Currently, he is working towards his Ph.D. on "System-Level-Test techniques for Automotive SoCs" at Politecnico di Torino in the CAD & Reliability group. His main interests are real-time operating systems, computer architectures, and their dependability.

Awards and Honors

Phd award document (2024)

Teaching

Teachings

Master of Science

Architetture dei sistemi di elaborazione. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Architetture dei sistemi di elaborazione. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Architetture dei sistemi di elaborazione. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Computer architectures. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

MostraNascondi A.A. passati

Research

Research groups

CAD - Electronic CAD & Reliability Group

Publications

PoliTO co-authors

Works published during the Ph.D. View all publications in Porto@Iris

Angione, Francesco (2025)
System-Level Test techniques for Automotive SoCs. relatore: BERNARDI, PAOLO; CANTORO, RICCARDO; , 37. XXXVII Ciclo, P.: 222
Doctoral Thesis
Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; ... (2025)
A System-Level Test Methodology for Communication Peripherals in System-on-Chips. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 731-739. ISSN 0018-9340
Contributo su Rivista
Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, ... (2023)
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress. In: IEEE TRANSACTIONS ON COMPUTERS, pp. 1447-1459. ISSN 0018-9340
Contributo su Rivista
Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; ... (2023)
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips. In: IEEE ACCESS, vol. 11, pp. 105655-105676. ISSN 2169-3536
Contributo su Rivista
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Contributo in Atti di Convegno (Proceeding)