AI, Data Analysis and Machine Learning in MicroController Performance Screening

• THE ITC/TTTC GERALD W. GORDON AWARD FOR STUDENT VOLUNTEER SERVICES The award honors the memory of Gerald W. Gordon, a well-known leader and activist in the IEEE and its test community and a long time member of the ITC Steering Committee. A certificate is presented annually to a current student for credible service to IEEE test technology related activities, programs and organizations. Qualification is enhanced by the level and number of contributions and dedication to service. (2024)

Corso di laurea di 1° livello

• Future of Work (Grandi Sfide - Tecnologie e Umanità). A.A. 2022/23, INGEGNERIA INFORMATICA. Collaboratore del corso
• Informatica. A.A. 2021/22, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2022/23, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2023/24, INGEGNERIA AEROSPAZIALE. Collaboratore del corso

• CAD - Electronic CAD & Reliability Group

• Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; ... (2024)
  COVID-19 Detection from Exhaled Breath. In: SCIENTIFIC REPORTS, vol. 14. ISSN 2045-2322
  Contributo su Rivista
• Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni (2024)
  U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration. In: The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023), Grasmere, Lake District, England (UK), September 22 – 26, 2023, pp. 364-378. ISSN 0302-9743. ISBN: 978-3-031-53968-8
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo' (2024)
  Computational Intelligence for Computer-Aided Design Machine Learning Techniques for Microcontrollers Performance Screenings. relatore: SQUILLERO, GIOVANNI; CANTORO, RICCARDO; , 37. XXXVII Ciclo, P.: 170
  Doctoral Thesis
• Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (2024)
  Embedded Feature Selection in MCU Performance Screening. In: IEEE 2nd International conference on Design, Test & Technology of Integrated Systems, Aix-en-Provence (FRA), October 14th -16th 2024, pp. 1-6. ISBN: 979-8-3503-6312-8
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (2023)
  Semi-Supervised Deep Learning for Microcontroller Performance Screening. In: 2023 IEEE European Test Symposium (ETS), Venezia (IT), 22-26 May 2023, pp. 1-6. ISBN: 979-8-3503-3634-4
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo' (2023)
  Machine Learning for Microcontroller Performance Screening. In: 2023 IEEE European Test Symposium, Venezia, (IT), 22-26 Maggio 2023
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (2023)
  Feature Selection for Cost Reduction in MCU Performance Screening. In: 24th IEEE Latin-American Test Symposium (LATS), Veracruz (MEX), 21-24 Marzo 2023, pp. 1-6. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; ... (2023)
  A Multi-Label Active Learning Framework for Microcontroller Performance Screening. In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, vol. 42, pp. 3436-3449. ISSN 0278-0070
  Contributo su Rivista
• Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (2023)
  Enabling Inter-Product Transfer Learning on MCU Performance Screening. In: IEEE 32nd Asian Test Symposium, Beijing (China), 14-17 October 2023, pp. 1-6. ISBN: 979-8-3503-0310-0
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (2022)
  Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data. In: IEEE International Symposium on On-Line Testing and Robust System 2022, Torino, 12-14 September 2022. ISBN: 978-1-6654-7355-2
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; ... (2021)
  Exploiting Active Learning for Microcontroller Performance Prediction. In: 2021 IEEE European Test Symposium, 24-28 May 2021, pp. 1-4. ISBN: 978-1-6654-1849-2
  Contributo in Atti di Convegno (Proceeding)