"PitchD, The PhD’s pitch" with Juan Balaguera, Nick Deligiannis and Amirhossein Ahmadi

From Deep Neural Network (DNN) to the impact of electromagnetic interference (EMI), in the next meeting of the cycle "PitchD, The PhD's pitch" organized by the IEEE Student Branch PoliTO of the Politecnico.

The speakers will be Juan Balaguera, Nick Deligiannis and Amirhossein Ahmadi.

Juan Balaguera - Department of Automation and Control Engineering-DAUIN of the Politecnico

• Estimating the reliability of DNNs in the face of permanent GPU hardware failures

Graphic Processing Units (GPUs) are crucial for modern Deep Neural Network (DNN) acceleration. However, these devices can be affected by faults that might jeopardize the DNNs' reliability. My research proposes fault simulation strategies to effectively assess the impact of permanent defects on GPUs regardless of the software implementation of the neural networks.

Nick Deligiannis - Department of Automation and Control Engineering-DAUIN of the Politecnico

• Functional Stimuli Generation for Burn-In Test

In high-reliability applications, Burn-In testing (BI) is crucial to combat early failures. Traditional static BI is inefficient for modern dense circuits. In this work, we propose automated methods able to generate effective, functional stress-inducing stimuli, especially for pipelined processors, destined for dynamic BI tests.

Amirhossein Ahmadi - Department of Electronics and Telecommunications-DET of the Politecnico

• Reliability and Performance Challenges of Next-Generation Smart Power Battery Management Systems for Electric Mobility

This project discusses the impact of electromagnetic interference (EMI) on the battery management systems (BMS) and BMS vertical interface (VIF). The susceptibility to EMI is tackled by transistor-level simulations and tests for the first time aiming to highlight the failure mechanisms and consequently to propose methods to enhance the performance.

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