Professore Ordinario (L.240)
Dipartimento Energia (DENERG)
- Componente Centro Interdipartimentale PEIC - Power Electronics Innovation Center
Profilo
Interessi di ricerca
Settore scientifico discliplinare
(Area 0009 - Ingegneria industriale e dell'informazione)
Linee di ricerca
- Misure di affidabilità e miglioramento delle prestazioni affidabilistiche di componenti elettronici di potenza
Competenze
Settori ERC
SDG
Partecipazioni scientifiche
- Componente del Consiglio/Comitato Direttivo - IEEE Power Electronics Society (PELS), Stati Uniti (2024-2026)
- Fellow (riconoscimento scientifico) - IEEE - Institute of Electrical and Electronics Engineers, Stati Uniti (2012-)
IEEE Senior Member - Socio effettivo o corrispondente - IEEE - Institute of Electrical and Electronics Engineers, Stati Uniti (2004-)
Comitati editoriali
- POWER ELECTRONIC DEVICES AND COMPONENTS (2022-), Direttore di rivista, collana editoriale, enciclopedia
Congressi
- ESREF - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Program chair (presidente/responsabile del comitato scientifico)
- ESREF - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Program chair (presidente/responsabile del comitato scientifico)
Altri incarichi di ricerca o didattica esterni
- Professore a contratto, presso Università degli Studi di PARMA (22/2/2021-30/3/2022)
- Attivita' di insegnamento (art. 23 L. 240/10), presso Università degli Studi di PARMA (22/2/2021-30/3/2022)
Didattica
Collegi di Dottorato
- TECNOLOGIE DELL'INFORMAZIONE, 2023/2024 (39. ciclo)
Università degli Studi di PARMA - TECNOLOGIE DELL'INFORMAZIONE, 2022/2023 (38. ciclo)
Università degli Studi di PARMA - TECNOLOGIE DELL'INFORMAZIONE, 2021/2022 (37. ciclo)
Università degli Studi di PARMA - TECNOLOGIE DELL'INFORMAZIONE, 2020/2021 (36. ciclo)
Università degli Studi di PARMA
Collegi dei Corsi di Studio
- Collegio di Ingegneria Elettrica ed Energetica. Componente
- Collegio di Ingegneria Informatica, del Cinema e Meccatronica. Componente invitato
Insegnamenti
Dottorato di ricerca
- Reliability of Power Electronics Devices. A.A. 2024/25, INGEGNERIA ELETTRICA, ELETTRONICA E DELLE COMUNICAZIONI. Titolare del corso
Corso di laurea magistrale
- Elettronica di potenza per l'energia. A.A. 2024/25, INGEGNERIA ELETTRICA. Collaboratore del corso
- Electrical Technologies for eMobility. A.A. 2024/25, MECHATRONIC ENGINEERING (INGEGNERIA MECCATRONICA). Collaboratore del corso
Corso di laurea di 1° livello
- Sistemi di propulsione elettrica per i trasporti. A.A. 2024/25, INGEGNERIA ELETTRICA. Collaboratore del corso
Pubblicazioni
Pubblicazioni per tipo
Coautori PoliTO
Pubblicazioni degli ultimi anni
Pubblicazioni degli ultimi anni Vedi tutte le pubblicazioni su Porto@Iris
- Cerutti, Stefano; Iannuzzo, Francesco; Sangwongwanich, Ariya; Kerekes, Tamas; Pavone, ... (2025)
Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile. In: 2025 IEEE Applied Power Electronics Conference and Exposition (APEC), Atlanta (USA), 16-20 marzo 2025, pp. 738-745. ISBN: 979-8-3315-1611-6
Contributo in Atti di Convegno (Proceeding) - Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede (2024)
Application-Oriented Flexible Power Cycling Test System for Power Electronic Components. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 12, pp. 5805-5816. ISSN 2168-6777
Contributo su Rivista - Zarghani, Mostafa; Iannuzzo, Francesco; Blaabjerg, Frede; Kaboli, Shahriyar (2024)
A Distributed Turn-Off Delay Compensator Scheme for Voltage Balancing of Series-Connected IGBTs. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 12, pp. 2545-2557. ISSN 2168-6777
Contributo su Rivista - Iannuzzo, Francesco (2024)
Large-Scale Adoption of Silicon Carbide in the Automotive Sector: What is Missing?. In: CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems, Dusseldorf (Germany), 12/03/2024 - 14/03/2024, pp. 678-683
Contributo in Atti di Convegno (Proceeding) - Zhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco; Blaabjerg, ... (2024)
Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests. In: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 71, pp. 15012-15023. ISSN 0278-0046
Contributo su Rivista - Baker, Nick; Dupont, Laurent; Michal Beczkowski, Szymon; Iannuzzo, Francesco (2024)
Proof-of-Concept for an On-Chip Kelvin-Emitter RTD Sensor for Junction Temperature Monitoring of IGBTs. In: IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY. PART C. MANUFACTURING, vol. 14. ISSN 1083-4400
Contributo su Rivista - Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede (2024)
Comparative Analysis of Bond Wire Degradation in Power Modules during DC and AC Power Cycling. In: 2024 IEEE 15th International Symposium on Power Electronics for Distributed Generation Systems, PEDG 2024, 23/06/2024 - 26/06/2024
Contributo in Atti di Convegno (Proceeding) - Zhan, Cao; Tang, Yizheng; Zhu, Lingyu; Wang, Weicheng; Gou, Yating; Ji, Shengchang; ... (2024)
Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix. In: IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 39, pp. 12490-12501. ISSN 0885-8993
Contributo su Rivista - Yao, Ran; Zhu, Zheyan; Li, Hui; Lai, Wei; Chen, Xianping; Iannuzzo, Francesco; Liu, ... (2024)
A Double-Sided Cooling Approach of Discrete SiC MOSFET Device Based on Press-Pack Package. In: IEEE OPEN JOURNAL OF POWER ELECTRONICS, vol. 5, pp. 1629-1640. ISSN 2644-1314
Contributo su Rivista - Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao (2024)
Model-Based Thermal Stress and Lifetime Estimation of DFIG Wind Power Converter. In: ENERGIES, vol. 17. ISSN 1996-1073
Contributo su Rivista - Zhang, Yi; Zhang, Yichi; Hon Wong, Voon; Kalker, Sven; Caruso, Antonio; Ruppert, Lukas; ... (2024)
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs. In: IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 39, pp. 11583-11595. ISSN 0885-8993
Contributo su Rivista - Lu, Zhebie; Iannuzzo, Francesco (2024)
In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay. In: IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 39, pp. 4735-4745. ISSN 0885-8993
Contributo su Rivista - Zhan, Cao; Wang, Weicheng; Tang, Yizheng; Li, Yixin; Iannuzzo, Francesco; Zhu, Lingyu; ... (2024)
A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 12, pp. 1068-1077. ISSN 2168-6777
Contributo su Rivista - Lu, Zhebie; Iannuzzo, Francesco (2024)
Online Junction Temperature Extraction for Cascode GaN Devices Based on Turn-On Delay. In: IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 39, pp. 10250-10260. ISSN 0885-8993
Contributo su Rivista - Yao, Ran; Duan, Zeyu; Li, Hui; Iannuzzo, Francesco; Lai, Wei; Chen, Xianping (2023)
Lifetime prediction for press pack IGBT device by considering fretting wear failure. In: MICROELECTRONICS RELIABILITY, vol. 145. ISSN 0026-2714
Contributo su Rivista - Lu, Zhebie; Iannuzzo, Francesco (2023)
Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices. In: 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe, Aalborg (Denmark), 04/09/2023 - 08/09/2023
Contributo in Atti di Convegno (Proceeding) - Philipps, Daniel A.; Xue, Peng; Ubostad, Tobias N.; Iannuzzo, Francesco; Peftitsis, ... (2023)
Low Inductive Characterization of Fast-Switching SiC MOSFETs and Active Gate Driver Units. In: IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, vol. 59, pp. 6384-6398. ISSN 0093-9994
Contributo su Rivista - Lu, Zhebie; Iannuzzo, Francesco (2023)
Accuracy estimation of low-current voltage drop method for junction temperature monitoring under DC power cycling. In: MICROELECTRONICS RELIABILITY, vol. 150. ISSN 0026-2714
Contributo su Rivista - Zhang, Kaichen; Iannuzzo, Francesco (2023)
Thermal Mapping of Power Modules Using Optical Fibers during AC Power Cycling Tests. In: APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition, Orlando (United States), 19/03/2023 - 23/03/2023, pp. 2630-2633
Contributo in Atti di Convegno (Proceeding) - Mdanat, Rand A. L.; Saeed, Sarah; Georgious, Ramy; Garcia, Jorge; Iannuzzo, Francesco (2023)
Optimization of a Bidirectional Boost Converter for Nanogrid Applications. In: 2023 IEEE Industry Applications Society Annual Meeting, IAS 2023, Nashville (United States), 29/10/2023 - 02/11/2023
Contributo in Atti di Convegno (Proceeding) - Baker, Nick; Lemmon, Andy; Iannuzzo, Francesco; Michal Beczkowski, Szymon; Austin, John; ... (2023)
Temperature Monitoring of Multi-Chip SiC MOSFET Modules: On-Chip RTDs vs. VSD(T). In: 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe, Aalborg (Denmark), 04/09/2023 - 08/09/2023
Contributo in Atti di Convegno (Proceeding) - Zhang, Kaichen; Sajjad Bahman, Amir; Iannuzzo, Francesco; Ramesh Chopade, Amol; Holst, ... (2023)
Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions. In: MICROELECTRONICS RELIABILITY, vol. 150. ISSN 0026-2714
Contributo su Rivista - Wang, Qiang; Zhang, Jingwei; Iannuzzo, Francesco; Jiang, Yizhan; Zhang, Weifeng; He, ... (2023)
Short-Circuit Fault Adaptive Analysis and Protection for SiC MOSFETs. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 11, pp. 4867-4881. ISSN 2168-6777
Contributo su Rivista - Zhan, Cao; Zhang, Yaxin; Tang, Yizheng; Iannuzzo, Francesco; Zhu, Lingyu; Ji, ... (2023)
Influence of Temperature on Bond Wire Fatigue of Gate Loops in IGBT Modules under Sinusoidal Vibration Stress. In: ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia : Green World with Power Electronics, Jeju (Korea, Republic of), 22/05/2023 - 25/05/2023, pp. 1349-1354
Contributo in Atti di Convegno (Proceeding) - Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao (2023)
Thermal Stress Emulation of Power Devices Subject to DFIG Wind Power Converter. In: PEDG 2023 - 2023 IEEE 14th International Symposium on Power Electronics for Distributed Generation Systems, Shanghai (China), 09/06/2023 - 12/06/2023, pp. 141-147
Contributo in Atti di Convegno (Proceeding) - Xue, Peng; Iannuzzo, Francesco (2023)
Ferrite Beads Design to Improve Turn-off Characteristics of Cascode GaN HEMTs: An Optimum Design Method. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 11, pp. 3184-3194. ISSN 2168-6777
Contributo su Rivista - Yu, Yue; Li, Hui; Yao, Ran; Iannuzzo, Francesco; Zhu, Zheyan; Chen, Xianping (2023)
Short-Circuit Capability Optimization of Press-Pack IGBT by Improving Active Edge Heat Dissipation. In: IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 38, pp. 6143-6156. ISSN 0885-8993
Contributo su Rivista - Oliveira, J.; Frey, P.; Morel, H.; Reynes, J. M.; Burky, J.; Coccetti, F.; Iannuzzo, F.; ... (2023)
Failure degradation similarities on power SiC MOSFET devices submitted to short-circuit stress and accelerated switching conditions. In: MICROELECTRONICS RELIABILITY, vol. 148. ISSN 0026-2714
Contributo su Rivista - Lu, Zhebie; Iannuzzo, Francesco (2023)
Junction temperature monitoring for cascode GaN devices using the Si MOSFET's body diode voltage drop. In: MICROELECTRONICS RELIABILITY, vol. 150. ISSN 0026-2714
Contributo su Rivista - Zhang, Kaichen; Leduc, Charles; Iannuzzo, Francesco (2023)
Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal. In: PCIM Europe 2023 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg (Germany), 09/05/2023 - 11/05/2023
Contributo in Atti di Convegno (Proceeding) - Zhang, Kaichen; Iannuzzo, Francesco; Holm Christiansen, Christian (2023)
Reliability of WBG, results of a Pre-Scoping Study. In: 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe, Aalborg (Denmark), 04/09/2023 - 08/09/2023
Contributo in Atti di Convegno (Proceeding) - Zhu, Ankang; Ye, Shuoyu; Kang, Jianlong; Xin, Zhen; Luo, Haoze; Iannuzzo, Francesco; Li, ... (2023)
Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode. In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, vol. 11, pp. 1754-1766. ISSN 2168-6777
Contributo su Rivista - Zhan, Cao; Zhu, Lingyu; Wang, Weicheng; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco (2023)
Multidimensional Mission-Profile-Based Lifetime Estimation Approach for IGBT Modules in MMC-HVdc Application Considering Bidirectional Power Transfer. In: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 70, pp. 7290-7300. ISSN 0278-0046
Contributo su Rivista - Lu, Zhebie; Iannuzzo, Francesco (2023)
Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy during Parameter Design. In: APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition, Orlando (United States), 19/03/2023 - 23/03/2023, pp. 632-636
Contributo in Atti di Convegno (Proceeding) - Valeriu Pirosca, Adrian; Vecchio, Marcello; Agatino Rizzo, Santi; Iannuzzo, Francesco (2023)
Evaluation of the Thermal Resistance in GaN HEMTs Using Thermo-Sensitive Electrical Parameters. In: ENERGIES, vol. 16. ISSN 1996-1073
Contributo su Rivista - Sun, Zhongchao; Bjorn Jorgensen, Asger; Baker, Nick; Beczkowski, Szymon; Guo, Wendi; ... (2023)
Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors. In: APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition, Orlando (United States), 19/03/2023 - 23/03/2023, pp. 1135-1140
Contributo in Atti di Convegno (Proceeding) - Liu, Renkuan; Li, Hui; Yao, Ran; Lai, Wei; Duan, Zeyu; Iannuzzo, Francesco (2023)
Investigation on the Short-circuit Withstand Capability of Press-pack IGBT modules with Optimized Package Structures. In: 2023 24th International Vacuum Electronics Conference, IVEC 2023, Chengdu (China), 25/04/2023 - 28/04/2023
Contributo in Atti di Convegno (Proceeding)