Anagrafe della ricerca

The overall aim of the project is to investigate and exploit quantized conductance effects in memristive devices for the realization of quantum-based standards of resistance working reliably, in air and at room temperature with scalability down to nanometer precision. In particular, the project focus is on the development of memristive model systems and nanometrological characterization techniques at the nanoscale in memristive devices for understanding and controlling quantized effects in memristive devices, enabling the realization of a standard of resistance implementable on-chip for self-calibrating systems with zero-chain traceability in the spirit of the revised SI.