Bachelor of Science

• Future of Work (Grandi Sfide - Tecnologie e Umanità). A.A. 2022/23, INGEGNERIA INFORMATICA. Collaboratore del corso
• Informatica. A.A. 2021/22, INGEGNERIA AEROSPAZIALE. Collaboratore del corso
• Informatica. A.A. 2022/23, INGEGNERIA AEROSPAZIALE. Collaboratore del corso

• Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (In stampa)
  Feature Selection for Cost Reduction in MCU Performance Screening. In: 24th IEEE Latin-American Test Symposium, Veracruz, (MEX), 21-24 Marzo 2023
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (In stampa)
  Semi-Supervised Deep Learning for Microcontroller Performance Screening. In: 2023 IEEE European Test Symposium, Venezia, (IT), 22-26 Maggio 2023
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; ... (2023)
  A Multi-Label Active Learning Framework for Microcontroller Performance Screening. In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, pp. 1-14. ISSN 0278-0070
  Contributo su Rivista
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; ... (2022)
  Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data. In: IEEE International Symposium on On-Line Testing and Robust System 2022, Torino, 12-14 September 2022. ISBN: 978-1-6654-7355-2
  Contributo in Atti di Convegno (Proceeding)