Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, ... (2025) APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation. In: DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Barcellona (ESP), 21-23 October 2025. ISBN: 979-8-3315-1489-1 Contributo in Atti di Convegno (Proceeding)