Ph.D. candidate in Ingegneria Informatica E Dei Sistemi , 39th cycle (2023-2026)
Department of Control and Computer Engineering (DAUIN)
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PhD
Research topic
Advanced Techniques for AI-Driven Test and Reliability of Digital Circuits
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Biography
Average score: 87/100 Ranking 7/163
Institute of Microelectronics, University of Chinese Academy of Sciences Microelectronics and Solid-State Electronics Direct PhD 2022 Class
Average score: 89/100
Politecnico di Torino Computer Control Engineering Dual Degree Doctoral Candidate 2024 Class
Average score: 93/100
FeFET testing and modeling: Modeling and testing of FeFET devices and circuits: propose a device-aware test method to test the device and circuit of FeFET. First, through the preparation and measurement of the device, it is found that the device has defects. By analyzing the behavior of the defect and modeling it, a defective compact model (Verilog-a) is obtained. Then, the circuit simulation is performed to obtain the fault model. According to the fault model, the test circuit is designed and the test plan is generated. The results were published in the test top conference ITC, ASP-DAC, and other related conferences.
Research
Research Areas/Fields/Groups
Publications
Latest publications View all publications in Porto@Iris
- Wang, Changhao; Yao, Xinhao; Chen, Danyang; Li, Chaobo; Li, Xiuyan; Yuan, Sicong; Xun, ... (In stampa)
From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics. In: The Fourteenth International Conference on Learning Representations (ICLR 2026), Rio de Janeiro, Brazil, April 23rd - 27th, 2026
Contributo in Atti di Convegno (Proceeding) - Wang, Changhao; Chen, Yijing; Bellarmino, Nicolo'; Rodriguez Condia, Josie Esteban; Li, ... (In stampa)
Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation. In: International Test Conference 2026 (ITC 2026), San Antonio, Texas, USA, October 11–16, 2026
Contributo in Atti di Convegno (Proceeding) - Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; ... (2026)
A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design. In: IEEE ELECTRON DEVICE LETTERS, vol. 47, pp. 1233-1236. ISSN 0741-3106
Contributo su Rivista - Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, ... (2025)
Device-Aware Test for Threshold Voltage Shifting in FeFET. In: IEEE International Test Conference 2025, San Diego (USA), 20-26 September 2025, pp. 410-413. ISBN: 979-8-3315-7041-5
Contributo in Atti di Convegno (Proceeding) - Wei, S.; Wang, C.; Yang, Y.; Wang, M. (2020)
Physical and Mechanical Properties of Gypsum-Like Rock Materials. In: ADVANCES IN CIVIL ENGINEERING, vol. 2020. ISSN 1687-8086
Contributo su Rivista
Knowledge Valorisation
Technology transfer
Patents and other intellectual properties
- AI-Assisted Software-Based Self-Test Generation for RISC-V Cores. national Software
Inventors: Nicolo' Bellarmino Riccardo Cantoro Josie Esteban Rodriguez Condia Giovanni Squillero Changhao Wang