Changhao Wang

Ph.D. candidate in Ingegneria Informatica E Dei Sistemi , 39th cycle (2023-2026)
Department of Control and Computer Engineering (DAUIN)

Profile

PhD

Research topic

Advanced Techniques for AI-Driven Test and Reliability of Digital Circuits

Tutors

Research interests

Computer architectures and Computer aided design
Data science, Computer vision and AI

Biography

Beijing University of Chemical Technology Mechanical Manufacturing and Automation 2018 Class || Dual Degree in Business Administration
Average score: 87/100 Ranking 7/163
Institute of Microelectronics, University of Chinese Academy of Sciences Microelectronics and Solid-State Electronics Direct PhD 2022 Class
Average score: 89/100
Politecnico di Torino Computer Control Engineering Dual Degree Doctoral Candidate 2024 Class
Average score: 93/100

FeFET testing and modeling: Modeling and testing of FeFET devices and circuits: propose a device-aware test method to test the device and circuit of FeFET. First, through the preparation and measurement of the device, it is found that the device has defects. By analyzing the behavior of the defect and modeling it, a defective compact model (Verilog-a) is obtained. Then, the circuit simulation is performed to obtain the fault model. According to the fault model, the test circuit is designed and the test plan is generated. The results were published in the test top conference ITC, ASP-DAC, and other related conferences.

Publications

Latest publications View all publications in Porto@Iris