Andrea Portaluri

Tutors

• Luca Sterpone

Master of Science

• Programmazione di sistema. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Programmazione di sistema. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Bachelor of Science

• Sistemi operativi. A.A. 2024/25, INGEGNERIA INFORMATICA. Collaboratore del corso
• Sistemi operativi. A.A. 2023/24, INGEGNERIA INFORMATICA. Collaboratore del corso
• Sistemi operativi. A.A. 2022/23, INGEGNERIA INFORMATICA. Collaboratore del corso

• Portaluri, Andrea; Azimi, Sarah; Saracino, Andrea; Sterpone, Luca; Kilic, Alp; Dupuis, ... (2024)
  NXRouting: A GPU-Enhanced CAD Tool for European Radiation-Hardened FPGAs. In: ELECTRONICS, vol. 13. ISSN 2079-9292
  Contributo su Rivista
• Portaluri, Andrea; DE SIO, Corrado; Sterpone, Luca (2023)
  Assessing the Robustness of Real-Time Operating System on Soft Processor against Multiple Bit Upset. In: 20th ACM International Conference on Computing Frontiers, Bologna (IT), May 9 - 11, 2023, pp. 207-208. ISBN: 9798400701405
  Contributo in Atti di Convegno (Proceeding)
• DE SIO, Corrado; Rizzieri, Daniele; Portaluri, Andrea; LA GRECA, SALVATORE GABRIELE; ... (2023)
  Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System. In: IEEE Symposium on On-Line Testing and Robust System Design -IOLTS, Chania, Crete (GRC), 03-05 July 2023, pp. 1-3. ISBN: 979-8-3503-4135-5
  Contributo in Atti di Convegno (Proceeding)
• Portaluri, Andrea; Azimi, Sarah; Sterpone, Luca (2023)
  Design Techniques for Multi-Core Neural Network Accelerators on Radiation-Hardened FPGAs. In: IEEE International Symposium on Parallel and Distributed Computing, Bucharest (Romania), 10-12 July 2023, pp. 16-22. ISBN: 979-8-3503-4127-0
  Contributo in Atti di Convegno (Proceeding)
• Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; ... (2023)
  Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems. In: ELECTRONICS, vol. 12. ISSN 2079-9292
  Contributo su Rivista