Gabriele Filipponi

Ph.D. candidate in Ingegneria Informatica E Dei Sistemi , 38^th cycle (2022-2025)
Department of Control and Computer Engineering (DAUIN)

Docente esterno e/o collaboratore didattico
Department of Control and Computer Engineering (DAUIN)

gabriele.filipponi@polito.it

Profile

PhD

Research topic

Manufacturing and In-Field Testing Techniques

Tutors

Research presentation

Poster

Research interests

Computer architectures and Computer aided design

Biography

G. Filipponi is a third-year Ph.D student in Computer and Control Engineering at Politecnico di Torino. He is part of the Electronic CAD & Reliability group, with a focus on Embedded electronics testing. His main field of research regards ultra reliability for in-field Automotive SoC, specifically exploiting the LBIST and functional procedures.

Teaching

Teachings

Bachelor of Science

Operating systems. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Sistemi operativi. A.A. 2024/25, INGEGNERIA INFORMATICA. Collaboratore del corso
Operating systems. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Sistemi operativi. A.A. 2023/24, INGEGNERIA INFORMATICA. Collaboratore del corso

MostraNascondi A.A. passati

Research

Research groups

CAD - Electronic CAD & Reliability Group (DAUIN)

Publications

Latest publications View all publications in Porto@Iris

Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; ... (2024)
A System-Level Test Methodology for Communication Peripherals in System-on-Chips. In: IEEE TRANSACTIONS ON COMPUTERS. ISSN 0018-9340
Contributo su Rivista
Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2024)
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips. In: ELECTRONICS, vol. 13. ISSN 2079-9292
Contributo su Rivista
Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, ... (2023)
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Tallinn (Estonia), 03-05 May 2023, pp. 21-26. ISBN: 979-8-3503-3277-3
Contributo in Atti di Convegno (Proceeding)
Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
Contributo in Atti di Convegno (Proceeding)
Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V. (2022)
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. In: 2022 IEEE International Test Conference (ITC), Anaheim (USA), 23-30 September 2022, pp. 646-649
Contributo in Atti di Convegno (Proceeding)