Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio (2023) A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. In: Conference on Very Large Scale Integration (VLSI-SoC 2023), Dubai (United Arab Emirates), October 16 - 18, 2023, pp. 1-6. ISBN: 979-8-3503-2599-7 Contributo in Atti di Convegno (Proceeding)