Ph.D. in Ingegneria Elettrica, Elettronica E Delle Comunicazioni , 33rd cycle (2017-2020)
Ph.D. obtained in 2021
Dissertation:
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices (Abstract)
Tutors:
Candido Pirri Sergio FerreroProfile
Research topic
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices
Research interests
Publications
Works published during the Ph.D. View all publications in Porto@Iris
- Cimmino, Davide (2021)
Enhanced Electrical and Reliability Testing of Power Semiconductor Devices. relatore: PIRRI, Candido; FERRERO, SERGIO; , 33. XXXIII Ciclo, P.: 150
Doctoral Thesis - Busca, Roberta; Cimmino, Davide; Ferrero, Sergio; Scaltrito, Luciano; Pirri, Candido; ... (2020)
Multilayer film passivation for enhanced reliability of power semiconductor devices. In: JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS, vol. 38. ISSN 2166-2746
Contributo su Rivista - Cimmino, Davide; Ferrero, Sergio (2020)
High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances. In: ELECTRONICS, vol. 9. ISSN 2079-9292
Contributo su Rivista - Cimmino, Davide; Busca, Roberta; Ferrero, Sergio; Pirri, Candido; Giovanni, Richieri; ... (2019)
High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices. In: MICROELECTRONICS RELIABILITY, vol. 100-101, pp. 1-5. ISSN 0026-2714
Contributo su Rivista