Luca Callegaro

• METROLOGIA, 2021/2022 (38. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2020/2021 (37. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2019/2020 (36. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2018/2019 (35. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2017/2018 (34. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2016/2017 (33. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2015/2016 (32. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2014/2015 (31. ciclo)
  Politecnico di TORINO
• METROLOGIA, 2013/2014 (30. ciclo)
  Politecnico di TORINO

PhD

• Quantum electronics for metrology. A.A. 2023/24, METROLOGIA. Teaching assistant
• Fundaments of metrology. A.A. 2023/24, METROLOGIA. Teaching assistant
• The measurement of electrical impedance. A.A. 2022/23, METROLOGIA. Main teacher
• Quantum electronics for metrology. A.A. 2022/23, METROLOGIA. Teaching assistant
• Quantum electronics for metrology. A.A. 2021/22, METROLOGIA. Teaching assistant
• Fundaments of metrology. A.A. 2021/22, METROLOGIA. Teaching assistant
• The measurement of electrical impedance. A.A. 2020/21, METROLOGIA. Main teacher
• The measurement of electrical impedance. A.A. 2019/20, METROLOGIA. Main teacher
• The measurement of electrical impedance. A.A. 2018/19, METROLOGIA. Main teacher

• Luca Fasolo. Programme in Metrologia (35^th cycle, 2019-2023)
  Thesis: Development of a Superconducting Platform for the Manipulation of Quantum States in the Microwave Regime
  
  Applied Metrology
  Applied Metrology

• Milano, Gianluca; Cultrera, Alessandro; Boarino, Luca; Callegaro, Luca; Ricciardi, Carlo (2023)
  Tomography of memory engrams in self-organizing nanowire connectomes. In: NATURE COMMUNICATIONS, vol. 14. ISSN 2041-1723
  Contributo su Rivista
• Cultrera, A.; Milano, G.; De Leo, N.; Ricciardi, C.; Boarino, L.; Callegaro, L. (2021)
  Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation. In: SCIENTIFIC REPORTS, vol. 11. ISSN 2045-2322
  Contributo su Rivista
• Milano, G.; Cultrera, A.; Bejtka, K.; De Leo, N.; Callegaro, L.; Ricciardi, C.; Boarino, ... (2020)
  Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials. In: ACS APPLIED NANO MATERIALS, vol. 3, pp. 11987-11997. ISSN 2574-0970
  Contributo su Rivista
• Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, ... (2020)
  Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations. In: METROLOGIA, vol. 57. ISSN 0026-1394
  Contributo su Rivista
• Cultrera, Alessandro; Tran, NGOC THANH MAI; D’Elia, Vincenzo; Ortolano, Massimo; ... (2019)
  Calibration of lock-in amplifiers in the low-frequency range. In: 23rd IMEKO TC4 International Symposium, Xi’an, China, September 17-20, pp. 122-125
  Contributo in Atti di Convegno (Proceeding)