Research Assistant
Department of Management and Production Engineering (DIGEP)
Adjunct lecturer/Adjunct instructor
Adjunct lecturer/Adjunct instructor
Department of Management and Production Engineering (DIGEP)
Teaching
Teachings
Master of Science
- Challenge@PoliTo by Firms - Fibercop - Monitoraggio Pali. A.A. 2025/26, INGEGNERIA GESTIONALE (ENGINEERING AND MANAGEMENT). Collaboratore del corso
- Challenge@PoliTo by Firms - Stellantis. A.A. 2025/26, INGEGNERIA GESTIONALE (ENGINEERING AND MANAGEMENT). Collaboratore del corso
- Challenge@PoliTo by Firms - WABTEC. A.A. 2024/25, INGEGNERIA GESTIONALE (ENGINEERING AND MANAGEMENT). Collaboratore del corso
Bachelor of Science
- Experimental statistics and mechanical measurement. A.A. 2025/26, INGEGNERIA MECCANICA (MECHANICAL ENGINEERING). Collaboratore del corso
- Experimental statistics and mechanical measurement. A.A. 2024/25, INGEGNERIA MECCANICA (MECHANICAL ENGINEERING). Collaboratore del corso
- Laboratorio di gestione della qualità e misure. A.A. 2023/24, TECNOLOGIE PER L'INDUSTRIA MANIFATTURIERA. Collaboratore del corso
- Statistica sperimentale e misure meccaniche. A.A. 2023/24, INGEGNERIA MECCANICA. Collaboratore del corso
- Laboratorio di gestione della qualità e misure. A.A. 2022/23, TECNOLOGIE PER L'INDUSTRIA MANIFATTURIERA. Collaboratore del corso
Publications
Latest publications View all publications in Porto@Iris
- Stamer, Florian; Lanza, Gisela; Puttero, Stefano; Galetto, Maurizio (2026)
Optimizing PCBA e-waste management: Intelligent inspection sequencing and recovery strategies using graph neural networks and Reinforcement Learning. In: JOURNAL OF MANUFACTURING SYSTEMS, vol. 86, pp. 264-276. ISSN 0278-6125
Contributo su Rivista - Puttero, Stefano; Verna, Elisa; Genta, Gianfranco; Galetto, Maurizio (2025)
Collaborative robots for quality control: an overview of recent studies and emerging trends. In: JOURNAL OF INTELLIGENT MANUFACTURING. ISSN 0956-5515
Contributo su Rivista - Puttero, Stefano; Verna, Elisa; Genta, Gianfranco; Galetto, Maurizio (2025)
Automatic component recognition and defect detection in electronic board recycling process. In: INTERNATIONAL JOURNAL OF COMPUTER INTEGRATED MANUFACTURING, pp. 1-16. ISSN 0951-192X
Contributo su Rivista - Puttero, S.; Verna, E.; Genta, G.; Galetto, M. (2025)
A value-driven approach to printed circuit board inspection: Strategic use of inspection technologies to reduce waste. In: XVII Convegno dell'Associazione Italiana delle Tecnologie Manifatturiere (XVII AITeM), Bari, 9-12 Settembre 2025, pp. 402-409. ISSN 2474-395X. ISBN: 978-1-64490-373-5
Contributo in Atti di Convegno (Proceeding) - Verna, E.; Puttero, S.; Genta, G.; Galetto, M. (2023)
A novel quality map for monitoring human well-being and overall defectiveness in product variants manufacturing. In: XVI Convegno dell'Associazione Italiana delle Tecnologie Manifatturiere (XVI AITeM), Napoli (Italy), 12-15 September 2023, pp. 412-419. ISSN 2474-395X. ISBN: 9781644902714
Contributo in Atti di Convegno (Proceeding)