Tutori

• Paolo Bernardi

Corso di laurea di 1° livello

• Sistemi operativi. A.A. 2023/24, INGEGNERIA INFORMATICA. Collaboratore del corso

• Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, ... (2023)
  Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. In: International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Tallinn (Estonia), 03-05 May 2023, pp. 21-26. ISBN: 979-8-3503-3277-3
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
  Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
  Contributo in Atti di Convegno (Proceeding)
• Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V. (2022)
  In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. In: 2022 IEEE International Test Conference (ITC), Anaheim (USA), 23-30 September 2022, pp. 646-649
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA ... (2022)
  Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin (USA), 19-21 October 2022
  Contributo in Atti di Convegno (Proceeding)
• Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (2022)
  An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)