Tutori

• Paolo Stefano Crovetti

• Ahmadi, Amirhossein; Bendotti, Valerio; Serratoni, Claudio; Crovetti, Paolo S. (2023)
  Simulation Analysis of the Bit Error Induced by EMI on Galvanically Isolated Data-Link Embedded in an Automotive Battery Management IC. In: ICEAA 2023 International Conference on Electromagnetics in Advanced Applications, Venice (IT), 9-13 Oct, 2023
  Contributo in Atti di Convegno (Proceeding)