Marta Musso

Research topic

Electrical quantum metrology, quantum Hall effect devices, impedance and low current metrology

Tutors

• Massimo Ortolano
• Martina Marzano

• Best Poster Award at the International School of Physics "Enrico Fermi" - Course 217 (2025)

Bachelor of Science

• Misure. A.A. 2025/26, INGEGNERIA ELETTRONICA. Collaboratore del corso
• Electronic measurements. A.A. 2025/26, INGEGNERIA ELETTRONICA. Collaboratore del corso
• Electronic Circuits. A.A. 2025/26, ELECTRONIC AND COMMUNICATIONS ENGINEERING (INGEGNERIA ELETTRONICA E DELLE COMUNICAZIONI). Collaboratore del corso

• Musso, Marta; Ortolano, Massimo (2026)
  Design and implementation of a transresistance amplifier for accurate current measurements in the microampere range. In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, vol. 75. ISSN 0018-9456
  Contributo su Rivista
• Scaletta, Dominick; Tran, Ngoc Thanh Mai; Musso, Marta; Ortiz Jimenez, Valery; Hill, ... (2026)
  Fabrication of graphene-based quantum Hall networks and influences of partial star-mesh recursion. In: MATERIALS RESEARCH EXPRESS, vol. 13, pp. 1-10. ISSN 2053-1591
  Contributo su Rivista
• Musso, Marta; Lin, Wei-Chen; Yang, Yanfei; Tran, Ngoc Thanh Mai; Panna, Alireza R.; ... (2025)
  A graphene star-mesh quantized Hall array resistance standard for the calibration of resistances at the GΩ level. In: International school of physics “Enrico Fermi”, Varenna (Ita)
  Contributo in Atti di Convegno (Proceeding)
• Scaletta, Dominick S.; Tran, Ngoc Thanh Mai; Musso, Marta; Jarrett, Dean G.; Hill, ... (2025)
  Graphene-based quantum Hall array pseudofractal designs via Minkowski–Bouligand algorithms. In: AIP ADVANCES, vol. 15, pp. 1-8. ISSN 2158-3226
  Contributo su Rivista
• Musso, Marta; Lin, Wei-Chen; Yang, Yanfei; Tran, Ngoc Thanh Mai; Panna, Alireza R.; ... (2025)
  Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration. In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, vol. 74, pp. 1-12. ISSN 0018-9456
  Contributo su Rivista