Master of Science

• GPU programming. A.A. 2021/22, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• GPU programming. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• Specification and simulation of digital systems. A.A. 2020/21, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Bachelor of Science

• Algoritmi e programmazione. A.A. 2020/21, INGEGNERIA ELETTRONICA. Collaboratore del corso
• Algoritmi e programmazione. A.A. 2021/22, INGEGNERIA ELETTRONICA. Collaboratore del corso
• Algoritmi e programmazione. A.A. 2022/23, INGEGNERIA ELETTRONICA. Collaboratore del corso
• Informatica. A.A. 2019/20, INGEGNERIA AEROSPAZIALE. Collaboratore del corso

• Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; ... (2023)
  Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems. In: ELECTRONICS, vol. 12. ISSN 2079-9292
  Contributo su Rivista
• Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca (2023)
  Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help”. In: INTELLIGENT SYSTEMS WITH APPLICATIONS, vol. 17, pp. 1-24. ISSN 2667-3053
  Contributo su Rivista
• Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah (2022)
  Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor. In: 19th ACM International Conference on Computing Frontiers 2022, Torino, May 2022, pp. 215-220
  Contributo in Atti di Convegno (Proceeding)
• Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca (2022)
  SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow. In: IEEE Radiation and its Effects on Components and Systems 2021, Vienna (Austria), 13-17 September 2021
  Contributo in Atti di Convegno (Proceeding)
• De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; ... (2022)
  Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor. In: IEEE Radiation and its Effects on Components and Systems 2022, pp. 1-4
  Contributo in Atti di Convegno (Proceeding)
• DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David (2022)
  Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Austin (USA), October, 2022, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L. (2022)
  A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS. In: MICROELECTRONICS RELIABILITY, vol. 138, pp. 1-5. ISSN 0026-2714
  Contributo su Rivista
• Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F. (2022)
  Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs. In: 21st IEEE International Symposium on Parallel and Distributed Computing, Basel (Switzerland), 11-13 July 2022, pp. 91-98
  Contributo in Atti di Convegno (Proceeding)
• Portaluri, Andrea; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca; Merodio Codinachs, ... (2022)
  Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices. In: IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022), Turin, 12-14 September 2022, pp. 1-7
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (2022)
  Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
  Contributo in Atti di Convegno (Proceeding)
• Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca (2022)
  On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications. In: 35th GI/ITG International Conference on Architecture of Computing Systems, Heilbronn (Germany), September, 2022, pp. 181-193. ISBN: 978-3-031-21866-8
  Contributo in Atti di Convegno (Proceeding)
• Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; ... (2022)
  Soft Error Reliability Prediction of SRAM-based FPGA Designs. In: IEEE Radiation and its Effects on Components and Systems 2022, Venice (Italy), October, 2022, pp. 1-4
  Contributo in Atti di Convegno (Proceeding)
• Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
  Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
  Contributo in Atti di Convegno (Proceeding)
• De Sio, C.; Azimi, S.; Sterpone, L. (2022)
  FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, vol. 10, pp. 549-563. ISSN 2168-6750
  Contributo su Rivista
• Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2022)
  A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC. In: IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design - SMACD 2022, Sardinia, Italy, June 2022, pp. 1-4
  Contributo in Atti di Convegno (Proceeding)
• Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L. (2022)
  Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs. In: VLSI-SoC: Technology Advancement on SoC Design / Grimblatt V., Chang C.H., Reis R., Chattopadhyay A., Calimera A., S.L., Springer, pp. 135-153. ISBN: 978-3-031-16818-5
  Contributo in Volume
• Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; ... (2021)
  Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis. In: NUCLEAR SCIENCE AND TECHNIQUES, vol. 32. ISSN 1001-8042
  Contributo su Rivista
• Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L. (2021)
  A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs. In: IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Glasgow, United Kingdom, 17-20 May 2021, pp. 1-5. ISBN: 978-1-7281-9539-1
  Contributo in Atti di Convegno (Proceeding)
• Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca (2021)
  Analysis of Single Event Effects on Embedded Processor. In: ELECTRONICS, vol. 10. ISSN 2079-9292
  Contributo su Rivista
• Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
  Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology. In: MICROELECTRONICS RELIABILITY, vol. 126. ISSN 0026-2714
  Contributo su Rivista
• Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
  On the Evaluation of SEEs on Open-Source Embedded Static RAMs. In: IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 4-7 October 2021, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca (2021)
  A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor. In: Design, Automation and Test in Europe Conference (DATE2021), 01-05 February 2021, pp. 252-257
  Contributo in Atti di Convegno (Proceeding)
• Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca (2021)
  A New Domains-based Isolation Design Flow for Reconfigurable SoCs. In: IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021), pp. 1-7
  Contributo in Atti di Convegno (Proceeding)
• De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca (2021)
  SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Athens (GR), 6-8 October 2019, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
  A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication. In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, vol. 29, pp. 1596-1600. ISSN 1063-8210
  Contributo su Rivista