Tommaso Foscale

Ph.D. candidate in Ingegneria Informatica E Dei Sistemi , 38^th cycle (2022-2025)
Department of Control and Computer Engineering (DAUIN)

Docente esterno e/o collaboratore didattico
Department of Control and Computer Engineering (DAUIN)

tommaso.foscale@polito.it

Profile

PhD

Research topic

Testing Techniques for Automotive Systems on Chip

Tutors

Research presentation

Poster

Research interests

Computer architectures and Computer aided design

Biography

Tommaso Foscale obtained a degree in Computer Engineering with a specialisation in Computer Networks and Cloud Computing from Politecnico di Torino. He graduated with the master's thesis, entitled "Sviluppo e valutazione di un tester Burn-In basato su architettura programmabile", in 2021, having obtained a grade of 110 cum laude. He is currently a third-year PhD student in Computer and Control Engineering at Politecnico di Torino, affiliated with the Electronic CAD & Reliability group, where he is conducting research in the field of embedded electronics testing. His primary area of investigation is the development of testing techniques for automotive system-on-chip (SoC) devices.

Teaching

Teachings

Bachelor of Science

Operating systems. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Sistemi operativi. A.A. 2024/25, INGEGNERIA INFORMATICA. Collaboratore del corso
Operating systems. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
Sistemi operativi. A.A. 2023/24, INGEGNERIA INFORMATICA. Collaboratore del corso

MostraNascondi A.A. passati

Research

Research groups

CAD - Electronic CAD & Reliability Group (DAUIN)

Publications

Latest publications View all publications in Porto@Iris

Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso (2024)
Exploring trade-offs in multi-site wafer testing. In: 25th IEEE Latin American Test Symposium 2024, Maceio (BRA), 09-12 April 2024. ISBN: 979-8-3503-6555-9
Contributo in Atti di Convegno (Proceeding)
DI GRUTTOLA GIARDINO, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; ... (2024)
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), Didcot (UK), 08-10 October 2024. ISBN: 979-8-3503-6688-4
Contributo in Atti di Convegno (Proceeding)
Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
Contributo in Atti di Convegno (Proceeding)
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Contributo in Atti di Convegno (Proceeding)
Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; ... (2022)
A novel SEU injection setup for Automotive SoC. In: 2022 IEEE International Symposium on Industrial Electronics, Anchorage, AK (USA), 01-03 June 2022, pp. 623-626. ISBN: 978-1-6654-8240-0
Contributo in Atti di Convegno (Proceeding)