
Ph.D. candidate in Metrologia , 37th cycle (2021-2024)
Department of Applied Science and Technology (DISAT)
Research Assistant
Department of Applied Science and Technology (DISAT)
Profile
PhD
Thesis title
Self-organized criticality in neuromorphic nanowire networks
Tutors
Teaching
Teachings
Master of Science
- Workshop "Hacking and exploiting a professional MEMS kit interfaced with Arduino board". A.A. 2023/24, NANOTECHNOLOGIES FOR ICTs (NANOTECNOLOGIE PER LE ICT). Collaboratore del corso
Bachelor of Science
- Physics I. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
Publications
Latest publications View all publications in Porto@Iris
- Michieletti, F; Pilati, D; Milano, G; Ricciardi, C (2025)
Self-organized Criticality in Neuromorphic Nanowire Networks With Tunable and Local Dynamics. In: ADVANCED FUNCTIONAL MATERIALS. ISSN 1616-301X
Contributo su Rivista - Pilati, Davide; Michieletti, Fabio; Cultrera, Alessandro; Ricciardi, Carlo; Milano, ... (2024)
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps. In: ADVANCED ELECTRONIC MATERIALS. ISSN 2199-160X
Contributo su Rivista - Michieletti, Fabio; Chen, Shaochuan; Weber, Carsten; Ricciardi, Carlo; Ohno, Takeo; ... (2024)
Influence of active electrode impurity on memristive characteristics of ECM devices. In: JOURNAL OF SOLID STATE ELECTROCHEMISTRY, vol. 28, pp. 1735-1741. ISSN 1432-8488
Contributo su Rivista - DE CARLO, Ivan; Baudino, Luisa; Klapetek, Petr; Serrapede, Mara; Michieletti, Fabio; De ... (2023)
"Electrical and Thermal Conductivities of Single CuxO Nanowires". In: NANOMATERIALS, vol. 13, pp. 1-13. ISSN 2079-4991
Contributo su Rivista - Gnoli, L.; Carnicelli, Giuseppe; Parisi, Alessio; Urbinati, L.; Kabashi, B.; ... (2019)
Fault tolerant photovoltaic array: a repair circuit based on memristor sensing. In: 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk (NL), 2019. ISBN: 978-1-7281-2260-1
Contributo in Atti di Convegno (Proceeding)