Research Assistant
Department of Control and Computer Engineering (DAUIN)
Adjunct lecturer/Adjunct instructor
Department of Control and Computer Engineering (DAUIN)
Teaching
Teachings
Bachelor of Science
- Computer sciences. A.A. 2026/27, INGEGNERIA DELL'AUTOVEICOLO. Collaboratore del corso
- Algoritmi e strutture dati. A.A. 2026/27, INGEGNERIA INFORMATICA. Collaboratore del corso
- Algoritmi e strutture dati. A.A. 2025/26, INGEGNERIA INFORMATICA. Collaboratore del corso
- Computer sciences. A.A. 2025/26, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2024/25, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2023/24, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
- Computer sciences. A.A. 2022/23, INGEGNERIA DELL'AUTOVEICOLO (AUTOMOTIVE ENGINEERING). Collaboratore del corso
Research
Research groups
Publications
Latest publications View all publications in Porto@Iris
- Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Garozzo, Giuseppe; Tancorre, Vincenzo (2026)
Optimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling. In: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS), pp. 1-7
Contributo in Atti di Convegno (Proceeding) - Iaria, Giusy; Filipponi, Gabriele; Foscale, Tommaso; Bertani, Claudia; Garozzo, ... (2026)
A Multi-Phase Diagnostic Flow Combining Scan-Based Refinement and Targeted Functional Tests for Automotive SoCs. In: IEEE ACCESS, pp. 1-1. ISSN 2169-3536
Contributo su Rivista - Angione, Francesco; Bernardi, Paolo; Giardino, Nicola Di Gruttola; Filipponi, Gabriele; ... (2026)
Advances in Testing and Reliability Benchmarks. In: 31st IEEE European Test Symposium, ETS 2026, Chania (GRC), 25-29 May 2026, pp. 1-10. ISBN: 979-8-3195-1763-0
Contributo in Atti di Convegno (Proceeding) - Ciullo, Alessandro; Eggersglüß, Stephan; Tille, Daniel; Glowatz, Andreas; Iaria, Giusy; ... (2025)
Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG. In: IEEE International Test Conference ASIA 2025, Tokyo (JPN), December 16–19, 2025, pp. 72-77. ISBN: 979-8-3315-7193-1
Contributo in Atti di Convegno (Proceeding) - Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo (2025)
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 74, pp. 3195-3209. ISSN 0018-9340
Contributo su Rivista