Ph.D. candidate in Ingegneria Informatica E Dei Sistemi , 38th cycle (2022-2025)
Department of Control and Computer Engineering (DAUIN)
Adjunct lecturer/Adjunct instructor
Department of Control and Computer Engineering (DAUIN)
Profile
PhD
Thesis title
Testing Techniques for Automotive Systems on Chip
Research topic
Testing Techniques for Automotive Systems on Chip
Tutors
Research presentation
Keywords
Teaching
Teachings
Bachelor of Science
- Operating systems. A.A. 2025/26, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
- Sistemi operativi. A.A. 2025/26, INGEGNERIA INFORMATICA. Collaboratore del corso
- Operating systems. A.A. 2024/25, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
- Sistemi operativi. A.A. 2024/25, INGEGNERIA INFORMATICA. Collaboratore del corso
- Operating systems. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
- Sistemi operativi. A.A. 2023/24, INGEGNERIA INFORMATICA. Collaboratore del corso
Research
Research groups
Publications
Latest publications View all publications in Porto@Iris
- Foscale, Tommaso; Bernardi, Paolo (2025)
A Cost–Benefit Analysis of Multi-Site Wafer Testing. In: ELECTRONICS, vol. 14. ISSN 2079-9292
Contributo su Rivista - Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso (2024)
Exploring trade-offs in multi-site wafer testing. In: 25th IEEE Latin American Test Symposium 2024, Maceio (BRA), 09-12 April 2024. ISBN: 979-8-3503-6555-9
Contributo in Atti di Convegno (Proceeding) - Di Gruttola Giardino, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; ... (2024)
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), Didcot (UK), 08-10 October 2024. ISBN: 979-8-3503-6688-4
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio (2023)
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. In: IEEE Latin-American Test Symposium, Veracruz (Mexico), 21-24 March 2023. ISBN: 979-8-3503-2597-3
Contributo in Atti di Convegno (Proceeding) - Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Contributo in Atti di Convegno (Proceeding)