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Metodologie per la massimizzazione della stress-coverage mediante applicazione di test strutturali e funzionali in ambiente System Level Test/Burn-In e Utilizzo di test funzionali per ridurre l’over-killing dovuto alle condizioni di
Duration: 16/05/2023 - 15/05/2024
Principal investigator(s): Contract type: Commercial Research
Partners STMICROELECTRONICS S.R.L.
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